Image Sensor Capacitor Vertical Stacking for Fill Factor

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional global shutter image sensors have a large capacitor that occupies most of the area, reducing the photodiode area and resulting in lower fill factor and increased parasitic light sensitivity.

Innovation Solution

The design includes a capacitor with a thin dielectric layer between a first and second electrode, where the second electrode extends to the edge of the photodiode, providing a light shielding effect and reducing parasitic light sensitivity, while the conductive plug and inter-layer dielectric layer configuration increases the photodiode area and fill factor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a large capacitor is arranged to increase storage capacitance, then the performance of global shutter image sensor is improved, but the capacitor occupies more than half of the area resulting in smaller photodiode area

Engineering Contradiction:
Improvestorage capacitanceVSAvoidphotodiode area
Core Design Contradiction:
ReliabilityVSArea of moving object

Solution Approach 1:

The capacitor structure transitions from a planar layout to a three-dimensional stacked configuration, with the first electrode on the semiconductor substrate, the dielectric layer above it, and the second electrode above the dielectric layer. This vertical stacking allows the capacitor to achieve high storage capacitance without occupying excessive lateral area, thereby preserving photodiode area while meeting capacitance requirements.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of moving object

If the area of the capacitor is reduced, then the photodiode area is increased, but poor image reading is obtained

Engineering Contradiction:
Improvephotodiode areaVSAvoidimage reading quality
Core Design Contradiction:
Area of moving objectVSReliability

Solution Approach 1:

The invention changes the key parameter of the capacitor from lateral area to vertical height by introducing a dielectric layer with high dielectric constant and increasing the electrode separation distance. This allows the capacitor to maintain high storage capacitance with reduced lateral footprint, enabling larger photodiode area while preserving image reading quality through adequate capacitance.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If the capacitor occupies large area, then storage capacitance is sufficient, but parasitic light sensitivity increases and fill factor decreases

Engineering Contradiction:
Improvestorage capacitanceVSAvoidparasitic light sensitivity
Core Design Contradiction:
ReliabilityVSObject-affected harmful factors

Solution Approach 1:

By stacking the capacitor vertically with the semiconductor substrate as the base layer, the dielectric layer in the middle, and the electrode structures above, the design achieves sufficient storage capacitance in the vertical dimension rather than expanding laterally. This reduces the capacitor's lateral footprint, thereby decreasing parasitic light sensitivity and increasing the fill factor while maintaining adequate capacitance for global shutter operation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration enhances the fill factor and reduces parasitic light sensitivity by increasing the capacitance value and area of the photodiode, while the light shielding effect minimizes image distortion and dark current.

Implementation Method 1

the capacitor includes a first electrode coupled to the memory node, a second electrode on the first electrode and extending to an edge of the photodiode, and a dielectric layer between the first and the second electrodes

Methodology Applied
Scientific EffectCapacitance: Capacitance

Implementation Method 2

the second electrode on the first electrode and extending to an edge of the photodiode, providing a light shielding effect and reducing parasitic light sensitivity

Methodology Applied
Scientific EffectLight shielding: Absorption (EM radiation)

Data Source

PatentUS10629644B1Image sensor and method of manufacturing the same
Publication Date: 2020.04.21 POWERCHIP TECH CORP
  • US10629644B1 patent drawing
  • US10629644B1 patent drawing
  • US10629644B1 patent drawing

AI summary

An image sensor includes a semiconductor substrate, a photodiode formed in the semiconductor substrate, a microlens disposed over the photodiode, a first transfer transistor, a second transfer transistor and a capacitor. The first transfer transistor and the second transfer transistor are formed on the semiconductor substrate, and a memory node is formed in the semiconductor substrate between the first transfer transistor and the second transfer transistor, wherein the first transfer transistor is coupled to the photodiode. The capacitor is formed between the first transfer transistor and the second transfer transistor, and the capacitor includes a first electrode coupled to the memory node, a second electrode on the first electrode and extending to an edge of the photodiode, and a dielectric layer between the first and the second electrodes.