Image Sensor Column Readout Noise Reduction via Temporal Segmentation

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Conventional CMOS image sensors face challenges in reducing sampling system noise and row-correlated visual artifacts due to overlapping sampling and readout operations, which increase susceptibility to noise during concurrent processing.

Innovation Solution

Implementing an image sensor with a two-dimensional array of pixels and output circuits that allow concurrent sample and read operations, where the AFE clock and column address sequences are suspended during sampling to minimize noise interference, enabling uninterrupted data flow and reduced noise capture.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If concurrent sampling and readout operations are implemented to reduce readout time, then productivity is improved, but susceptibility to system noise increases causing row-correlated visual artifacts

Engineering Contradiction:
Improveframe readout rateVSAvoidsystem noise
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

The patent segments the concurrent sampling and readout operation into distinct time phases by suspending the column address sequence during sampling periods. This temporal segmentation allows sampling to occur without simultaneous readout activity, eliminating the noise correlation problem while preserving the overall concurrent operation architecture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements periodic suspension of the column address sequence at specific intervals during the sampling operation. This periodic control mechanism temporarily halts readout addressing during critical sampling windows, reducing noise susceptibility while maintaining high overall productivity through rapid resumption of readout operations.

Inventive Principle:
Principle #19Periodic action

2Measurement precision

If clock signals are turned off during sampling to reduce system noise, then measurement precision is improved, but readout operation cannot proceed concurrently

Engineering Contradiction:
Improvenoise reductionVSAvoidreadout time
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent segments the clock signal control into row-specific intervals, suspending the column address sequence only during sampling periods for individual rows while maintaining continuous operation for other rows. This selective temporal segmentation reduces noise during sampling without halting the entire readout operation, preserving productivity.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent dynamically adjusts the column address sequence timing based on the sampling phase. The suspension and resumption of addressing signals is controlled adaptively during the sampling window, allowing the system to optimize noise reduction for each row while maintaining continuous throughput across the entire array.

Inventive Principle:
Principle #15Dynamics

Data Source

PatentUS8525910B2Suspending column readout in image sensors
Publication Date: 2013.09.03 OMNIVISION TECHNOLOGIES INC
  • US8525910B2 patent drawing
  • US8525910B2 patent drawing
  • US8525910B2 patent drawing

AI summary

An image sensor includes a two-dimensional array of pixels having multiple column outputs and an output circuit connected to each column output. Each output circuit is configured to operate concurrent sample and read operations. An analog front end (AFE) circuit processes pixel data output from the output circuits and an AFE clock controller transmits an AFE clocking signal to the AFE circuit to effect processing of the pixel data. A timing generator outputs a column address sequence that is received by a column decoder. During one or more sample operations the AFE clock controller suspends the output of the AFE clocking signal and the timing generator suspends the output of the column address sequence during the sample operation. The output of the AFE clocking signal and the column address sequence resume at the end of the sample operation.