Solid-State Image Sensor Correction Pixel Architecture
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Solution Overview
Problem
Existing image sensors, including back-illuminated ones, face challenges in achieving collective exposure of all pixels due to light leakage into charge retention parts, leading to image distortion and reduced sensitivity, especially when correction pixels are used to correct image quality deterioration caused by leakage charges, which can decrease resolution and area efficiency.
Innovation Solution
A solid-state image sensor with a shared pixel structure that includes correction pixels with elements formed on the light receiving parts, allowing for the output of a correction pixel signal to correct pixel signals from other pixels, while also expanding the areas of light receiving parts by sharing amplification, selection, and reset transistors, thereby reducing light leakage and improving signal characteristics.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If correction pixels are arranged within the pixel region to correct image quality deterioration caused by leakage charges, then image quality is improved, but resolution and area efficiency decrease
Solution Approach 1:
The patent moves correction pixels outside the active pixel region into a separate correction pixel region, utilizing spatial dimensionality change. This allows correction functionality to be added without consuming area within the pixel array, thereby maintaining resolution while improving image quality through leakage charge correction
2Reliability
If correction pixels are arranged within the pixel region to correct image quality deterioration caused by leakage charges, then image quality is improved, but area efficiency decreases
Solution Approach 1:
The patent relocates correction pixels to a separate region outside the main pixel array, effectively utilizing unused or peripheral areas of the sensor structure. This spatial reorganization allows correction functionality to be added without reducing the area available for active pixels, thereby maintaining area efficiency while improving image quality
3Reliability
If light shielding structures are implemented to prevent light leakage into charge retention parts, then image quality is improved, but device complexity increases
Solution Approach 1:
The patent extracts the correction functionality from the main pixel structure and places it in a separate correction pixel region. This separation eliminates the need for complex light shielding structures within the pixel array, as the correction pixels are positioned where they can measure leakage charges without requiring additional shielding, thereby improving image quality while reducing structural complexity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables the acquisition of more excellent pixel signals by effectively correcting for light leakage-induced signal increases, enhancing image quality and sensitivity without compromising resolution or area efficiency.
Implementation Method 1
light receiving parts receiving light to generate charge
Data Source
AI summary
There is provided a solid-state image sensor including pixels each at least including light receiving parts receiving light to generate charge, a transfer part transferring the charge accumulated in the light receiving parts, and memory parts holding the charge transferred via the transfer part, and a predetermined number of elements shared by the plurality of pixels, the predetermined number of elements being for outputting a pixel signal at a level corresponding to the charge, wherein one or some of the plurality of pixels is/are a correction pixel(s) outputting a correction pixel signal used for correcting a pixel signal outputted from pixels other than the one or some of the plurality of pixels, and one or some of the predetermined number of elements is/are formed on a wiring layer side of the light receiving parts included in the correction pixel(s).