Spectral-Filter Image Sensor Layout for Autofocus Crosstalk Suppression

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Solution Overview

Problem

Phase-detection autofocus image sensors in compact cameras suffer from optical crosstalk due to light reflection from shields, affecting focus accuracy.

Innovation Solution

A crosstalk-suppressing image sensor design featuring a semiconductor substrate with a photodiode, an opaque layer partially covering the light-exposure region, and a spectral filter adjacent to the opaque layer, which absorbs oblique optical rays and reduces crosstalk by blocking unwanted light.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If shields are used to restrict illumination angles for phase detection, then phase detection capability is improved, but optical crosstalk increases due to light reflection from the shields

Engineering Contradiction:
Improvephase detection accuracyVSAvoidoptical crosstalk
Core Design Contradiction:
Measurement precisionVSObject-generated harmful factors

Solution Approach 1:

A spectral filter layer is introduced as an intermediary component between the shield structure and the photodiode. This filter selectively transmits the wavelength range of interest while blocking reflected light that causes crosstalk, thereby mediating between the phase detection requirement and the crosstalk suppression need

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The spectral filter is applied locally at specific positions adjacent to the opaque layer, creating different optical properties in different regions. The filter allows desired light to reach the photodiode while blocking reflected light from the shield, providing localized crosstalk suppression without affecting overall phase detection capability

Inventive Principle:
Principle #3Local quality

2Measurement precision

If opaque layers are added to block light for phase detection, then phase detection capability is improved, but device complexity increases

Engineering Contradiction:
Improvephase detection accuracyVSAvoidsensor structure complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The spectral filter layer serves multiple functions simultaneously: it acts as a wavelength selector for phase detection, a crosstalk suppressor by blocking reflected light, and potentially an anti-reflective element. This multi-functionality reduces the need for additional separate components, thereby managing device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The spectral filter is integrated with the existing sensor structure, combining the phase detection functionality with the crosstalk suppression function in a single layered structure. The filter is positioned adjacent to the opaque layer, merging multiple optical control functions into one compact arrangement

Inventive Principle:
Principle #5Merging (Combining)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution effectively suppresses optical crosstalk, enhancing focus accuracy and image quality in compact cameras by ensuring only intended light reaches the photodiode, thereby improving phase-detection autofocus performance.

Implementation Method 1

a spectral filter adjacent to the opaque layer in the image-plane direction, and partially covering the light-exposure region... which absorbs oblique optical rays and reduces crosstalk by blocking unwanted light

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Data Source

PatentUS12148777B2Image sensor with spectral-filter-based crosstalk suppression
Publication Date: 2024.11.19 OMNIVISION TECHNOLOGIES INC
  • US12148777B2 patent drawing
  • US12148777B2 patent drawing
  • US12148777B2 patent drawing

AI summary

A crosstalk-suppressing image sensor includes a semiconductor substrate, an opaque layer, and a spectral filter. The semiconductor substrate includes a photodiode therein and is located beneath a light-exposure region of a back surface of the semiconductor substrate. The opaque layer is on the back surface, partially covers the light-exposure region, and has an opaque-layer thickness perpendicular to an image-plane direction parallel to the back surface. The spectral filter is adjacent to the opaque layer in the image-plane direction, and partially covers the light-exposure region.