Image Sensor Phase Detection Pixel with Off-Center Electrode Slit

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Solution Overview

Problem

Conventional image pickup devices with organic photoelectric conversion films and phase difference detection pixels suffer from light leakage through slits in the lower electrode, leading to noise and color mixture, which affects image quality and autofocus precision.

Innovation Solution

The image pickup device incorporates a lower electrode section that is unevenly divided to avoid the center of the incident light, with a transparent upper electrode and a reflective lower electrode, and optionally includes a light-shielding section to prevent light leakage, allowing for precise phase difference detection and improved image signal generation.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the lower electrode is provided with a slit at the optical center, then light can pass through to reach the PD for phase difference detection, but noise and color mixture are generated due to light leakage

Engineering Contradiction:
Improvephase difference detection precisionVSAvoidnoise and color mixture
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

The lower electrode is divided into multiple segments (first lower electrode section and second lower electrode section) with a slit positioned away from the optical center. This segmentation allows light to pass through for phase difference detection while preventing excessive light leakage that causes noise and color mixture.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The slit is positioned at a specific location away from the optical center rather than uniformly distributed. This local positioning optimizes the balance between allowing sufficient light for phase difference detection and minimizing light leakage-induced noise and color mixture in different regions of the pixel.

Inventive Principle:
Principle #3Local quality

2Device complexity

If the PD is omitted to simplify the structure, then device complexity is reduced, but light leaks from the slit to the lower layer side generating noise

Engineering Contradiction:
Improvepixel structure complexityVSAvoidnoise from light leakage
Core Design Contradiction:
Device complexityVSObject-affected harmful factors

Solution Approach 1:

The lower electrode is segmented into multiple sections with a strategically positioned slit, enabling the structure to function without requiring a separate PD layer while still controlling light leakage to minimize noise generation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The slit that could potentially cause light leakage and noise is strategically positioned away from the optical center, converting what could be a harmful feature into a beneficial design that enables simplified structure while controlling noise through optimized light path management.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

3Ease of manufacture

If the lower electrode is uniformly divided, then manufacturing is simplified, but the center of incident light is not avoided leading to noise generation

Engineering Contradiction:
Improveelectrode fabrication simplicityVSAvoidnoise from uncontrolled light leakage
Core Design Contradiction:
Ease of manufactureVSObject-affected harmful factors

Solution Approach 1:

The lower electrode is divided asymmetrically with the slit positioned away from the optical center rather than uniformly. This asymmetric design prevents the center of incident light from aligning with the slit, reducing light leakage and noise while remaining manufacturable.

Inventive Principle:
Principle #4Asymmetry

Solution Approach 2:

The electrode division is optimized locally by positioning the slit away from the optical center, creating different properties in different regions: the central region maintains light concentration for efficient photoelectric conversion while peripheral regions have the slit for phase difference detection without excessive leakage.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration effectively inhibits noise and color mixture, enhancing the sensitivity and separation ratio of pixel outputs, enabling high-precision image plane phase difference autofocus and improved image quality.

Implementation Method 1

a first photoelectric conversion section that generates an electric charge in response to incident light

Methodology Applied
Scientific EffectPhotoelectric conversion: Photoelectric Effect

Implementation Method 2

the upper electrode section including a member that transmits light

Methodology Applied
Scientific EffectLight transmission:

Implementation Method 3

the lower electrode section including a member that reflects light

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentUS11849219B2Image pickup device and electronic apparatus with an image plane phase difference detection pixel
Publication Date: 2023.12.19 SONY SEMICON SOLUTIONS CORP
  • US11849219B2 patent drawing
  • US11849219B2 patent drawing
  • US11849219B2 patent drawing

AI summary

The present disclosure relates to an image pickup device that enables inhibition of occurrence of color mixture or noise, and an electronic apparatus. The image pickup device of the present disclosure includes an image plane phase difference detection pixel for obtaining a phase difference signal for image plane phase difference AF. The image plane phase difference detection pixel includes: a first photoelectric conversion section that generates an electric charge in response to incident light; an upper electrode section that is one of electrodes disposed facing each other across the first photoelectric conversion section, the upper electrode section being formed on an incident side of the incident light on the first photoelectric conversion section; and a lower electrode section that is another of the electrodes disposed facing each other across the first photoelectric conversion section, the lower electrode section being formed on an opposite side of the incident side of the incident light on the first photoelectric conversion section, the lower electrode section being multiple-divided at a position that avoids a center of the incident light. The present disclosure is applicable to image sensors.