Vehicle Image Sensor Fault Detection Under Real-Time Parameter Changes
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Solution Overview
Problem
Existing in-vehicle image sensors face challenges in accurately detecting defects due to real-time changes in parameters such as temperature and supply voltage, which can affect data processing and compromise operational safety and reliability, particularly in autonomous navigation operations.
Innovation Solution
An image sensor system comprising a pixel data generation circuit, pattern data generation circuit, image signal processor, and detection circuit, which generates and processes test pattern data to detect malfunctions by comparing the function characteristics of processed data with predefined tendencies, ensuring accurate detection of defects even under varying conditions.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If real-time data processing is performed on input data affected by temperature and supply voltage changes, then the image sensor can operate under varying environmental conditions, but the accuracy of defect detection deteriorates due to parameter variations affecting data processing
Solution Approach 1:
The patent introduces test pattern data as an intermediary element to mediate between the varying environmental conditions and the defect detection process. The test pattern data serves as a reference that undergoes the same processing as actual image data, allowing the system to distinguish between variations caused by environmental factors and those caused by actual defects. This intermediary approach enables accurate defect detection while maintaining operation under varying temperature and supply voltage conditions.
2Ease of operation
If test pattern data with constant value is input to check for defects, then the defect detection process is simple, but the detection accuracy deteriorates because the test cannot account for real-time parameter changes during operation
Solution Approach 1:
The patent applies parameter changes by transforming the test pattern from static constant values to dynamic patterns that reflect real-time operating conditions. The test pattern data is processed through the same signal processing pipeline as actual image data, with parameters such as temperature and supply voltage being considered. This allows the test to accurately reflect how the system behaves under varying conditions while maintaining a systematic and operationally simple defect detection process.
3Adaptability or versatility
If data processing is performed based on parameters that change in real time, then the system can adapt to environmental variations, but the complexity of the data processing system increases
Solution Approach 1:
The patent segments the data processing system into distinct functional modules: a test pattern generation unit, a signal processing unit that handles both test and actual image data, and a defect detection unit. This segmentation allows the system to handle real-time parameter changes in a structured manner, where each module performs a specific function. The test pattern processing path is separated from but parallel to the actual image processing path, reducing overall system complexity while maintaining adaptability to environmental variations.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enhances the accuracy and precision of defect detection in image sensors, improving operational performance, reliability, and safety, ensuring compliance with vehicle-related functional safety standards like ISO 26262, and enhancing autonomous navigation safety.
Implementation Method 1
a pixel data generation circuit configured to convert a received optical signal into an electrical signal to transmit pixel data
Data Source
AI summary
An image sensor includes: a pixel data generation circuit configured to convert a received optical signal into an electrical signal to transmit pixel data; a pattern data generation circuit configured to generate test pattern data based on the pixel data and that includes a plurality of data values and has a function characteristic that is defined by an arranged order of the plurality of data values in the test pattern data; an image signal processor configured to process the pixel data based on parameters that change in real time to generate image data, and to process the test pattern data based on the parameters to generate test pattern processed data; and a first detection circuit configured to detect whether the image signal processor is malfunctioning based on comparing the function characteristic of the test pattern data with a function characteristic of the test pattern processed data.