Image Sensor Readout Circuit for Light-Independent Inspection Signals
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Solution Overview
Problem
Conventional semiconductor devices are limited in their ability to output digital signals containing information other than that based on incident light, which hinders inspection and diagnostic processes, particularly in complex systems like imaging systems where sensitivity to light can complicate inspections.
Innovation Solution
A semiconductor device is designed with a combination of pixel units and signal generation units arranged in rows and columns, where pixel units generate signals based on incident light and signal generation units produce predetermined digital signals, allowing for the output of inspection signals independent of light incidence, facilitating simplified inspection and parallel operation with normal signal output.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If a semiconductor device uses only pixel units to output digital signals, then the device can output signals based on incident light, but it cannot output inspection signals independent of light incidence
Solution Approach 1:
The patent applies multi-functionality by enabling pixel units to serve dual purposes: detecting incident light during normal operation and generating inspection signals when activated by control signals. This allows the same hardware structure to fulfill both imaging and self-inspection functions, eliminating the need for separate inspection hardware and resolving the contradiction between versatility and complexity.
Solution Approach 2:
The patent implements dynamics by making the function of pixel units switchable between light detection and inspection signal generation through control signals. The pixel units can dynamically change their operational mode based on external control, allowing the device to adapt between normal imaging mode and inspection mode without permanent structural changes, thus maintaining simplicity while achieving versatility.
2Reliability
If a semiconductor device adds signal generation units for inspection purposes, then inspection capability is improved, but device complexity increases
Solution Approach 1:
The patent makes existing pixel units multi-functional by enabling them to generate inspection signals in addition to their primary light detection function. This approach avoids adding separate inspection hardware, as the same pixel units serve both imaging and inspection purposes when activated by control signals, thereby improving reliability without significantly increasing device complexity.
Solution Approach 2:
The patent implements self-service by enabling the semiconductor device to perform self-inspection using its own pixel units. The device uses its internal resources (pixel units and readout circuits) to generate and output inspection signals, eliminating the need for external inspection equipment and reducing overall system complexity while improving self-diagnostic capability.
3Productivity
If pixel units are used for both light detection and inspection signal generation, then inspection efficiency is improved, but signal output accuracy may be affected
Solution Approach 1:
The patent applies periodic action by separating light detection and inspection signal generation into different time periods through control signals. During normal operation, pixel units detect light; during inspection periods, they generate inspection signals. This temporal separation ensures that both functions can be performed accurately without interference, maintaining signal output precision while achieving efficient inspection capability.
Solution Approach 2:
The patent uses dynamics by enabling pixel units to switch between detection modes based on control signals. The units can dynamically transition from light detection mode to inspection signal generation mode and back, allowing accurate performance of each function during its designated operational period without compromising the precision of either function.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enables the semiconductor device to output digital signals including inspection information not reliant on incident light, simplifying the inspection process and allowing for concurrent pixel signal output, thereby improving inspection efficiency and accuracy.
Implementation Method 1
a plurality of pixels configured to output a signal in response to incidence of light
Data Source
AI summary
Provided is a semiconductor device including: first signal generation units arranged so as to form rows and columns and corresponding to pixels configured to output a signal in response to incidence of light, each of the first signal generation units being configured to output a first digital signal in response to an output from a corresponding pixel; second signal generation units arranged corresponding to at least a part of the rows and the columns, each of the second signal generation units being configured to output a second digital signal having a predetermined digital value; and a readout unit configured to output a signal based on at least one of the first digital signal and the second digital signal that is output from a selected part of the first signal generation units and the second signal generation units.