Image Sensor Pad Segmentation for Stable Dark Signal Correction
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Solution Overview
Problem
The image quality of imaging devices degrades due to fluctuations in reference voltage caused by incident light, as described in Japanese Patent Application Laid-Open No. 2015-50706, which affects shading correction processing.
Innovation Solution
The imaging device incorporates a pixel array with separate pad portions for voltage supply lines in aperture and light-shielded regions, where the pad portions are configured differently to suppress voltage fluctuations, ensuring a stable dark signal independent of incident light, allowing for accurate correction processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If a single pad portion supplies reference voltage to both aperture and light-shielded pixel regions, then device complexity is reduced, but voltage fluctuations occur due to incident light affecting the dark signal
Solution Approach 1:
The single pad portion is divided into two separate pad portions: a first pad portion for the aperture pixel region and a second pad portion for the light-shielded pixel region. This segmentation allows independent voltage supply to each region, preventing incident light from causing voltage fluctuations that would affect the dark signal in the light-shielded region.
Solution Approach 2:
Different pad portions are provided for different functional regions (aperture and light-shielded pixels) based on their specific requirements. The light-shielded region requires isolation from light-induced voltage fluctuations to maintain stable dark signal, while the aperture region receives light for normal imaging operations.
2Reliability
If separate pad portions are provided for aperture and light-shielded pixel regions, then dark signal stability is improved, but device complexity increases
Solution Approach 1:
The reference voltage supply is segmented into separate pad portions for aperture and light-shielded regions. Each pad portion independently supplies reference voltage to its respective region, ensuring that the light-shielded region's dark signal remains stable and unaffected by incident light on the aperture region.
Solution Approach 2:
The light-shielded pixel region is effectively extracted from the influence of incident light by providing it with a separate pad portion. This extraction isolates the dark signal measurement from the harmful effect of light-induced voltage fluctuations in the aperture region.
3Ease of manufacture
If reference voltage is supplied to light-shielded pixels affected by incident light, then manufacturing is simplified, but measurement precision of dark signal deteriorates
Solution Approach 1:
The voltage supply configuration is segmented into separate pad portions for aperture and light-shielded regions. This segmentation ensures that the dark signal measurement in the light-shielded region is not contaminated by voltage fluctuations caused by incident light on the aperture region, thereby improving measurement precision.
Solution Approach 2:
The light-shielded region is provided with a dedicated pad portion that supplies reference voltage independently of the aperture region. This local quality differentiation ensures that the dark signal measurement environment remains stable and free from light-induced interference.
Data Source
AI summary
An imaging device includes: a first pad portion that is connected to a voltage supply line in an aperture pixel region, and to which a reference voltage from outside of the semiconductor substrate is supplied; and a second pad portion that is connected to the voltage supply line in the light-shielded pixel region, and to which the reference voltage from outside of the semiconductor substrate is supplied, the second pad portion being separated from the first pad portion.


