Image Sensor Pixel Gate Structure for Higher Fill Factor

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Solution Overview

Problem

Conventional image sensor devices have a reduced fill factor due to laterally extending pixel transistors, which limits the area available for photodiodes, thereby decreasing quantum efficiency and overall performance.

Innovation Solution

The image sensor device incorporates pixel transistors with gate features that partially extend into the semiconductor substrate, reducing the lateral distance and allowing more photodiodes to be disposed over a given chip area, thereby increasing the fill factor and quantum efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If pixel transistors are planarly formed with gate features extending only laterally along the major surface, then the manufacturing process is simple, but the fill factor is reduced due to increased lateral space occupation

Engineering Contradiction:
Improvemanufacturing simplicityVSAvoidfill factor
Core Design Contradiction:
Ease of manufactureVSArea of stationary object

Solution Approach 1:

The gate feature is configured to extend in both lateral directions along the major surface and vertically into the semiconductor substrate, transitioning from a two-dimensional planar structure to a three-dimensional structure. This vertical extension reduces the lateral footprint of the transistor, thereby increasing the fill factor while maintaining manufacturing feasibility through standard semiconductor processing techniques.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Area of stationary object

If gate features extend partially into the semiconductor substrate, then the fill factor is increased by reducing lateral distance, but the manufacturing process becomes more complex

Engineering Contradiction:
Improvefill factorVSAvoidtransistor structure complexity
Core Design Contradiction:
Area of stationary objectVSDevice complexity

Solution Approach 1:

The gate feature extends vertically into the semiconductor substrate, utilizing the third dimension to reduce lateral space occupation. This structural change increases the fill factor while the added complexity is managed through integration with existing semiconductor fabrication processes.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If more photodiodes are disposed over a given chip area, then the quantum efficiency is improved, but the transistor structure must occupy less lateral space

Engineering Contradiction:
Improvequantum efficiencyVSAvoidtransistor lateral footprint
Core Design Contradiction:
ReliabilityVSArea of stationary object

Solution Approach 1:

By extending the gate feature vertically into the semiconductor substrate, the transistor's lateral footprint is reduced. This allows more photodiodes to be packed into a given chip area, thereby increasing the fill factor and improving quantum efficiency without requiring additional lateral space.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design significantly enhances the performance of the image sensor device by increasing the fill factor and quantum efficiency while maintaining the same chip area, improving the detection and conversion of incident light into electrical signals.

Implementation Method 1

Each pixel includes at least one photosensitive diode (hereinafter 'photodiode') configured to detect the incident light and convert the detected incident light into an electrical signal (e.g., a photocurrent/current signal)

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS20240055449A1Novel image sensor device
Publication Date: 2024.02.15 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20240055449A1 patent drawing
  • US20240055449A1 patent drawing
  • US20240055449A1 patent drawing

AI summary

A semiconductor device includes: a photodiode formed in a substrate; and at least one transistor having a gate feature that comprises a first portion and a second portion coupled to an end of the first portion, the first portion disposed above and extending along a major surface of the substrate and the second portion extending from the major surface of the substrate into the substrate, wherein the photodiode and the at least one transistor at least partially form a pixel.