Image Sensor Defect Detection for Adaptive Static Pixels

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Solution Overview

Problem

Existing image sensors face challenges in accurately detecting defective pixels, which can occur during manufacturing or due to pixel failure or deterioration, affecting image data quality.

Innovation Solution

An image sensor with a defect detector that adaptively identifies static defective pixels in fixed locations by analyzing multiple images based on average pixel values, gain values, and light exposure times, and corrects these pixels using neighboring pixel values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a wafer test is performed to detect defective pixels during manufacturing, then defective pixels can be identified early, but defective pixels may still occur after manufacturing due to pixel failure or deterioration

Engineering Contradiction:
Improvedefective pixel detection reliabilityVSAvoidoperational lifespan before pixel failure
Core Design Contradiction:
ReliabilityVSDuration of action of stationary object

Solution Approach 1:

The system performs preliminary defective pixel detection during wafer test using a first defective pixel map, then continuously monitors for additional defective pixels during operation by comparing current pixel values against this pre-established map. This preliminary action allows early identification of manufacturing defects while preparing for future operational failures.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The system implements continuous feedback by repeatedly capturing images, detecting defective pixels in real-time, updating the defective pixel map with newly detected pixels, and using this updated information to correct subsequent images. This closed-loop feedback ensures ongoing detection of both manufacturing and operational defective pixels.

Inventive Principle:
Principle #23Feedback

2Measurement precision

If multiple images are captured and analyzed to detect defective pixels, then detection accuracy improves, but processing time and computational complexity increase

Engineering Contradiction:
Improvedefective pixel detection accuracyVSAvoidimage processing time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The system performs preliminary analysis by capturing multiple test images during initialization and generating a first defective pixel map before normal operation begins. This preliminary action consolidates the computationally intensive analysis work upfront, allowing faster real-time detection during subsequent image capture using the pre-computed reference map.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

Instead of analyzing entire images globally for defective pixels, the system focuses computational resources on local pixel-level comparisons against the defective pixel map. By concentrating analysis on specific pixel locations identified as potentially defective rather than processing all pixels uniformly, the system achieves high detection accuracy with reduced overall processing time.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If defective pixels are corrected using neighboring pixel values, then image quality improves, but the correction process adds computational overhead

Engineering Contradiction:
Improveimage data qualityVSAvoidcorrection algorithm complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The correction process applies local quality by using only neighboring pixel values surrounding each defective pixel location, rather than processing the entire image or using complex global correction algorithms. This localized approach maintains high image quality while minimizing computational overhead by limiting the correction scope to immediate neighborhoods of defective pixels.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The system performs self-service correction by automatically detecting defective pixels and correcting them using available neighboring pixel data without requiring external intervention or complex external processing systems. The image sensor itself generates and applies the correction, reducing overall system complexity while maintaining image quality.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12519926B2Image sensor and method of detecting defective pixels
Publication Date: 2026.01.06 SK HYNIX INC
  • US12519926B2 patent drawing
  • US12519926B2 patent drawing
  • US12519926B2 patent drawing

AI summary

An image sensor includes a pixel array including pixels and a controller configured to control the pixels to produce a plurality of images. The image sensor also includes a defect detector configured to determine a target image based on an average green pixel value and a gain value related to a light exposure time among the images, and detect an adaptive static defective pixel, which is a defective pixel with a fixed location based on pixel values included in the target image.