Integrated Image Sensor Test Board for Faster Signal Transfer
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Solution Overview
Problem
Conventional image sensor testing systems face slow signal transfer and high costs due to separate modules connected by wired connections, leading to prolonged processing times and significant space requirements.
Innovation Solution
Integration of the image capturing, storage, and processing modules on a single mainboard with integrated circuits, allowing direct access and storage of image signals, reducing the need for wired connections and minimizing transfer time and physical space.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If separate modules (image capturing module and signal processing module) are connected by wired connections, then system modularity and ease of assembly are improved, but signal transfer speed and processing time deteriorate
Solution Approach 1:
The patent merges the image capturing module, image storage module, and signal processing module onto a single mainboard, eliminating wired connections between separate modules. This integration allows image signals to be transferred directly from the capturing module to the processing module through the integrated circuit, dramatically reducing processing time while maintaining system functionality.
2Adaptability or versatility
If separate modules are connected by wired connections, then system flexibility and ease of configuration are improved, but signal transfer speed deteriorates
Solution Approach 1:
By integrating all modules on one mainboard, the patent eliminates the bottleneck of wired signal transmission. The integrated circuit enables direct, high-speed signal transfer from the image capturing module to the signal processing module, achieving both speed and flexibility through unified module design.
3Ease of manufacture
If separate modules are used, then system scalability and ease of maintenance are improved, but physical space requirements and cost deteriorate
Solution Approach 1:
The patent consolidates multiple separate modules into a single integrated unit on one mainboard. This merging significantly reduces the physical space required for the testing system while maintaining the functional capabilities of each module. The integrated design also simplifies maintenance by reducing the number of separate components that need to be diagnosed and replaced.
Data Source
AI summary
The present invention saves space by having an image sensor testing system that includes an image capturing module, an image storage module, and a signal processing module that are integrated on a mainboard. The mainboard uses multiple wires to respectively electrically connect to the image capturing module, the image storage module, and the signal processing module, and the image storage module is electrically connected to the image capturing module and the signal processing module. The image capturing module captures an image signal generated by an image sensor, the image storage module stores the image signal, and the signal processing module processes the image signal into a processed image signal and analyzes the processed image signal to obtain an image test value. The image capturing module and the signal processing module both directly access the image storage module, allowing the image test value to be calculated with less processing time.