Image Sensor Tilt Determination via Interference Pattern Analysis
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Solution Overview
Problem
Current methods for determining the tilt of an image sensor in cameras are unreliable due to difficulties in identifying reflections from the image sensor amidst multiple reflections, which can lead to poor image quality if not aligned precisely with the optics.
Innovation Solution
A method involving the use of an interference pattern produced by the image sensor to determine its tilt, where the zeroth-order interference is identified and measured relative to a predetermined center point or after rotating the camera, allowing for precise tilt calculation without relying on precise center point identification.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional reflection measurement methods are used to determine image sensor tilt, then the measurement process is simple, but the reliability is poor due to difficulty in identifying reflections from the image sensor amidst multiple reflections
Solution Approach 1:
The patent utilizes interference patterns (colorful fringes) generated by monochromatic light reflecting off the image sensor surface. These interference patterns create distinctive visual signatures that allow reliable identification of image sensor reflections among multiple reflections from other optical surfaces. The interference pattern acts as a unique identifier for the image sensor reflection.
Solution Approach 2:
The patent changes the parameter of light wavelength to monochromatic light and utilizes the resulting interference pattern characteristics. By analyzing the spatial distribution and characteristics of interference fringes, the system can reliably distinguish image sensor reflections from other reflections in the optical path.
2Reliability
If increased number of pixels and decreased pixel pitch are implemented in image sensors, then image quality increases, but sensitivity to misalignments between image sensor and optics increases
Solution Approach 1:
The patent performs tilt measurement and alignment verification before final assembly or during the manufacturing process. By using the interference pattern method to pre-assess image sensor alignment, manufacturers can make corrective adjustments before the sensor is permanently mounted, ensuring high precision alignment is achieved without requiring extremely tight manufacturing tolerances.
Solution Approach 2:
The patent replaces mechanical alignment methods with optical measurement methods. Instead of relying solely on mechanical precision of mounting fixtures, the system uses optical interference patterns to detect and quantify alignment errors, enabling non-contact, high-precision measurement of image sensor tilt.
3Ease of operation
If laser beam method is used to measure image sensor tilt, then the measurement setup is straightforward, but it is difficult to determine which reflection originates from the image sensor due to multiple reflections
Solution Approach 1:
The patent uses monochromatic light (such as laser) that produces interference patterns with distinctive color fringes when reflecting off the image sensor. These interference patterns provide a unique visual signature that allows operators to easily identify which reflection originates from the image sensor, solving the identification problem while maintaining the simplicity of laser-based measurement.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances the reliability of tilt determination by isolating reflections from the image sensor, enabling detection of small tilt angles (0.1 degrees) and reducing uncertainty, thus ensuring higher image quality.
Implementation Method 1
identifying an interference pattern in the reflected light
Implementation Method 2
receiving light reflected from the image sensor
Data Source
AI summary
A method for determining a tilt of an image sensor surface plane in a camera in relation to a lens reference plane of the camera includes sending light onto the image sensor, receiving light reflected from the image sensor, identifying an interference pattern in the reflected light, identifying a feature of the interference pattern, and determining the tilt of the image sensor surface plane based on a position of the feature identified in the interference pattern.