Solid-State Image Sensor Light Waveguide Refractive Index Barrier

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Solution Overview

Problem

Existing solid-state image sensors face issues with light entering adjacent photoelectric conversion elements, causing noise and color mixture due to the propagation of light between high-refractive-index material layers and oblique light entry, which decreases sensitivity and resolution.

Innovation Solution

A solid-state image sensor structure is developed with a semiconductor substrate, featuring a first insulating film with openings filled with high-refractive-index material, a second insulating film with specific thickness to control light waveguides, and a third insulating film with a lower refractive index, ensuring that light is efficiently directed to the photoelectric conversion element while minimizing incidence on adjacent elements.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If a light waveguide is formed by filling a through hole with high-refractive-index material, then light collection efficiency is improved, but light may enter adjacent photoelectric conversion elements causing noise and color mixture

Engineering Contradiction:
Improvelight collection efficiencyVSAvoidnoise and color mixture
Core Design Contradiction:
ProductivityVSObject-affected harmful factors

Solution Approach 1:

A low-refractive-index third insulating film is introduced as an intermediary layer between the high-refractive-index light waveguide and the surrounding environment. This intermediary layer prevents light from leaking into adjacent pixels by creating a refractive index barrier, while still allowing the light waveguide to effectively collect and guide light to the photoelectric conversion element.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The patent applies different refractive index properties to different spatial regions: the light waveguide maintains high refractive index for effective light guidance, while the third insulating film provides low refractive index specifically at the boundaries between adjacent pixels to prevent light leakage. This localized differentiation of optical properties resolves the contradiction between light collection and light isolation.

Inventive Principle:
Principle #3Local quality

2Measurement precision

If pixel size is reduced to increase pixel count, then imaging resolution is improved, but sensitivity of photoelectric conversion element decreases

Engineering Contradiction:
Improveimaging resolutionVSAvoidsensitivity
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent addresses the sensitivity loss from reduced pixel size by extending the light collection function into the vertical dimension through the light waveguide structure. Instead of relying solely on the horizontal light-receiving area, the waveguide captures oblique light from above and guides it vertically to the photoelectric conversion element, effectively compensating for the reduced surface area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The light waveguide performs preliminary light collection and concentration before light reaches the photoelectric conversion element. By pre-concentrating oblique light rays through total internal reflection within the waveguide, the system ensures that maximum light energy is delivered to the reduced-size photoelectric conversion element, maintaining sensitivity despite smaller pixel dimensions.

Inventive Principle:
Principle #10Preliminary action

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This structure effectively captures light and suppresses noise and color mixture, enhancing the sensitivity and resolution of the image sensor by ensuring that light is properly converged onto the photoelectric conversion elements.

Implementation Method 1

light propagates while being reflected by the upper and lower surfaces of the high-refractive-index material layer arranged on the planarizing layer between adjacent light waveguides

Methodology Applied
Scientific EffectTotal reflection of light: Total Internal Reflection

Implementation Method 2

a light waveguide is formed by filling a through hole 41 formed in a planarizing layer with a high-refractive-index material

Methodology Applied
Scientific EffectRefraction of light: Refraction

Implementation Method 3

collect light using total reflection of light

Methodology Applied
Scientific EffectTotal reflection of light: Total Internal Reflection

Data Source

PatentUS9054243B2Solid-state image sensor and imaging system
Publication Date: 2015.06.09 CANON KK
  • US9054243B2 patent drawing
  • US9054243B2 patent drawing
  • US9054243B2 patent drawing

AI summary

A solid-state image sensor including photoelectric conversion elements, comprises a first insulating film arranged on a substrate and having openings arranged on the respective elements, insulator portions having a refractive index higher than that of the first insulating film and arranged in the respective openings, a second insulating film arranged on upper surfaces of the insulator portions and an upper surface of the first insulating film, and a third insulating film having a refractive index lower than that of the second insulating film and arranged in contact with an upper surface of the second insulating film, wherein letting λ be a wavelength of entering light, n be the refractive index of the second insulating film, and t be a thickness of the second insulating film in at least part of a region on the upper surface of the first insulating film, a relation t<λ/n is satisfied.