Image Test System Clock Generation Circuit Signal Jitter Reduction
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Solution Overview
Problem
Current image test systems face challenges with C-PHY signal transmission due to longer data paths, leading to increased energy consumption, delay, and signal jitter, which affect the accuracy of the test system, especially since C-PHY signals lack clock information for correction.
Innovation Solution
An image test system with a test assembly and image capture card that includes a test signal clock generation circuit to obtain and transmit a test signal clock directly from the test signal, aligning the clock timing with the signal, and using interface conversion circuits to adapt signal forms, thereby reducing phase differences and improving data quality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Speed
If C-PHY signal transmission is used to replace D-PHY signal, then signal transmission speed is improved, but signal jitter and timing accuracy deteriorate due to longer data paths and lack of clock information
Solution Approach 1:
The patent segments the signal transmission path by introducing separate clock and data transmission channels. The clock signal is transmitted through a dedicated clock path while data is transmitted through data paths, allowing independent optimization of timing and data transmission. This segmentation resolves the contradiction by maintaining high-speed data transmission while ensuring accurate timing through separate clock distribution.
Solution Approach 2:
The patent introduces a clock signal as an intermediary element that mediates between the transmitted data and the receiving end. By providing a reference clock signal that travels through the same transmission medium as the data, the system enables timing correction and synchronization at the receiver, thereby maintaining measurement precision while utilizing high-speed C-PHY transmission.
2Device complexity
If data transmission path length is increased due to substrate layout limitations, then device integration is improved, but energy consumption and signal delay increase
Solution Approach 1:
The patent merges the clock signal transmission with the data transmission path by using the same physical medium (test assembly) for both signals. This combining approach allows the system to achieve better integration without requiring separate dedicated clock routing, thereby reducing overall path length and associated energy consumption while maintaining device integration benefits.
3Device complexity
If data transmission path length is increased due to substrate layout limitations, then device integration is improved, but signal delay increases affecting test accuracy
Solution Approach 1:
The patent implements a feedback mechanism where the receiver uses the transmitted clock signal to measure and correct for path delay. By comparing the transmitted clock with the received data timing, the system can calculate delay compensation values and adjust timing accordingly, thereby eliminating the adverse effects of increased path length on signal delay while maintaining integrated device architecture.
4Adaptability or versatility
If interface conversion is performed to adapt signal forms, then compatibility is improved, but device complexity increases
Solution Approach 1:
The patent achieves universality by designing the transmission interface to handle both clock and data signals through the same physical medium and using unified signal processing techniques. This multi-functional approach allows a single interface design to support multiple signal types and transmission modes, thereby improving compatibility without proportionally increasing device complexity through multiple specialized conversion circuits.
Data Source
AI summary
An image test system includes a test assembly and an image capture card. The test assembly is provided for obtaining a test signal from a test object, and includes an interface conversion circuit for converting signal transmission form of the test signal. The image capture card is provided for obtaining the test signal from the test assembly, and obtaining an image data from the test signal. The image test system further includes a test signal clock generation circuit for obtaining a test signal clock from the test signal, or the image capture card further includes a pair of clock input pins for obtaining the test signal clock directly from the test object.