Imaging-Based Calibration of Multi Electron Beam Guns

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Solution Overview

Problem

In additive manufacturing systems using multiple electron beam guns, interaction between the electron beams can occur due to magnetic interference, which is difficult to prevent with shielding and can slow down the process, especially when shielding is impractical or undesirable.

Innovation Solution

A calibration system that includes an imaging device to capture images of the electron beam impingement on a surface within the build chamber and an analysis component to determine calibration parameters, allowing for precise adjustment of the electron beam guns to minimize interaction and optimize their movement and precision.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple electron beam guns are used to increase productivity, then manufacturing speed increases, but magnetic interference between beams occurs causing process slowdowns

Engineering Contradiction:

Improvemanufacturing speedVSAvoidprocess slowdown

Core Design Contradiction:

ProductivityVSLoss of time

Solution Approach 1:

The system uses an imaging device to capture images of electron beam impingement on the build surface, and an analysis component processes these images to determine calibration parameters. This feedback loop enables real-time monitoring and adjustment of beam positions and characteristics, allowing multiple electron beam guns to operate simultaneously without magnetic interference causing process slowdowns.

Inventive Principle:

Principle #23Feedback

Solution Approach 2:

The calibration system adjusts various parameters including coil values for electron beam guns, beam positioning, and timing synchronization. By dynamically changing these parameters based on image analysis data, the system optimizes the operation of multiple electron beam guns to maintain high productivity while avoiding interference-related slowdowns.

Inventive Principle:

Principle #35Parameter changes

2Object-affected harmful factors

If shielding is added to prevent magnetic interference, then beam interaction is reduced, but device complexity and manufacturing cost increase

Engineering Contradiction:

Improvebeam interactionVSAvoidshielding structure

Core Design Contradiction:

Object-affected harmful factorsVSDevice complexity

Solution Approach 1:

The system replaces mechanical shielding structures with a software-based calibration and control system. The imaging device captures beam impingement patterns, and the analysis component calculates calibration parameters that adjust coil values and beam timing. This substitution eliminates the need for complex physical shielding while still preventing harmful beam interactions.

Inventive Principle:

Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The imaging device and analysis component serve as intermediaries between the multiple electron beam guns and the build surface. Instead of using physical shielding to block interference, the system uses these intermediary components to monitor and coordinate beam operations, adjusting parameters to prevent harmful interactions without adding mechanical complexity.

Inventive Principle:

Principle #24Intermediary (Mediator)

3Manufacturing precision

If calibration precision is increased to minimize beam interaction, then manufacturing accuracy improves, but measurement and calibration complexity increases

Engineering Contradiction:

Improvebeam positioning accuracyVSAvoidcalibration complexity

Core Design Contradiction:

Manufacturing precisionVSDifficulty of detecting and measuring

Solution Approach 1:

The imaging device creates visual copies (images) of the electron beam impingement on the build surface. Instead of requiring complex direct measurement of beam positions and characteristics, the system captures images that represent the beam patterns, making it easier to analyze and calibrate. The analysis component then processes these image copies to determine the calibration parameters needed for precise beam positioning.

Inventive Principle:

Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enables quicker and more accurate formation of metallic articles by avoiding beam interactions and eliminating the need for shielding, thus enhancing the efficiency of the electron beam melting process.

Implementation Method 1

an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber

Methodology Applied

Scientific EffectElectron beam: Electron Beam

Data Source

PatentUS11925983B2Devices, systems, and methods for using an imaging device to calibrate and operate a plurality of electron beam guns in an additive manufacturing system

Publication Date: 2024.03.12 ARCAM AB

AI summary

Calibration systems, additive manufacturing systems employing the same, and methods of calibrating include a plurality of electron beam guns. One calibration system includes an imaging device positioned to capture one or more images of an impingement of electron beams emitted from the plurality of electron beam guns on a surface within a build chamber of the electron beam additive manufacturing system and an analysis component communicatively coupled to the imaging device. The analysis component is programmed to receive image data corresponding to the one or more images, determine one or more calibration parameters from the image data, and transmit one or more instructions to the plurality of electron beam guns in accordance with the one or more calibration parameters.