Solid State Imaging Device Row Drive Circuit Failure Detection
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Solid state imaging devices with complex scanning circuits face higher failure rates, necessitating a solution for detecting failures in both readout and shutter scan circuits effectively.
Innovation Solution
The implementation of a solid state imaging device with a switching unit that alternates between two states, allowing for failure detection by switching the functions of signal generation units between readout and shutter scan signals, enabling detection of failures in both circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple signal generation units are used for readout and shutter scan, then failure detection capability is improved, but device complexity increases
Solution Approach 1:
The patent makes signal generation units capable of performing multiple functions by switching between generating readout scan signals and shutter scan signals. Each signal generation unit can be configured to generate either type of signal, allowing the same hardware to serve dual purposes and enabling failure detection without requiring completely separate dedicated circuits for each function.
Solution Approach 2:
The patent introduces dynamic switching capability where the function of signal generation units can be changed during operation. The switching unit allows the system to alternate between different signal generation configurations, enabling the detection of failures in both readout and shutter scan circuits using the same physical components at different times.
2Use of energy by moving object
If signal generation units are switched between readout and shutter scan functions, then power consumption is reduced, but failure detection coverage may be compromised
Solution Approach 1:
The patent implements periodic switching between different signal generation modes. The switching unit alternates between configuring signal generation units for readout scan and shutter scan functions at different time periods. This periodic reconfiguration allows the system to detect failures in both circuit types while keeping the actual number of active signal generation units lower than would be required if all units operated simultaneously in dedicated modes.
Data Source
AI summary
Provided is a solid state imaging device including: a pixel unit; row drive circuits respectively corresponding to rows of the pixel unit, each including a first and a second signal generation units; drive signal generation unit configured to generate a readout scan signal and a shutter scan signal, as drive signals for driving pixels, based on signals output from the first and the second signal generation units; and a switching unit configured to switch the row drive circuit between: a first state in which the first signal generation unit generates the readout scan signal and the second signal generation unit generates the shutter scan signal and a second state in which the first signal generation unit generates the shutter scan signal and the second signal generation unit generates the readout scan signal.