Solid-State Imaging Element Conversion Efficiency Control

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Solution Overview

Problem

In solid-state imaging elements, the conversion efficiency of charge to voltage is locked to a minimum when transferring charge from a low-sensitivity photodiode due to the connection configuration, limiting the dynamic range expansion of image data.

Innovation Solution

A solid-state imaging element with high-sensitivity and low-sensitivity transfer transistors, amplification transistors, and conversion efficiency control transistors that allow for controlled conversion efficiency by switching these transistors to optimize charge transfer and voltage signal output, including a driving circuit to manage the transfer and output of signals from multiple charge storage units.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If both switching transistors are switched on to transfer charge from the low-sensitivity photodiode, then charge transfer is enabled, but the conversion efficiency is locked to a minimum value

Engineering Contradiction:
Improvecharge transfer capabilityVSAvoidconversion efficiency
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent introduces conversion efficiency control transistors that dynamically adjust the connection configuration between charge storage units and floating diffusion regions. By switching these control transistors on or off, the system can change the effective capacitance connected to the floating diffusion, thereby adjusting the conversion efficiency from minimum to maximum values while maintaining the ability to transfer charge from low-sensitivity photodiodes.

Inventive Principle:
Principle #15Dynamics

2Measurement precision

If conversion efficiency is maximized by switching off both switching transistors, then charge to voltage conversion efficiency is improved, but charge transfer from low-sensitivity photodiode is blocked

Engineering Contradiction:
Improveconversion efficiencyVSAvoidcharge transfer capability
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent introduces conversion efficiency control transistors as intermediary elements between the switching transistors and the floating diffusion region. These control transistors mediate the connection, allowing the system to achieve both charge transfer and high conversion efficiency by selectively connecting charge storage units to the floating diffusion region based on the sensitivity of the photodiode and the desired conversion efficiency level.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Adaptability or versatility

If multiple charge storage units are connected to expand dynamic range, then image data dynamic range is improved, but dark current noise increases

Engineering Contradiction:
Improvedynamic rangeVSAvoiddark current noise
Core Design Contradiction:
Adaptability or versatilityVSObject-generated harmful factors

Solution Approach 1:

The patent applies different conversion efficiency settings to different charge storage units based on their specific function. High-sensitivity photodiodes use one conversion efficiency setting while low-sensitivity photodiodes use another, allowing each region to be optimized for its specific purpose. This local optimization enables dynamic range expansion while minimizing dark current noise in each specific region.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Improves the conversion efficiency of charge to voltage, enabling higher dynamic range and reduced dark current noise, thereby enhancing the quality of image data capture.

Implementation Method 1

a high-sensitivity photodiode (311) having a sensitivity higher than a predetermined sensitivity and a low-sensitivity photodiode (312) having a sensitivity lower than the predetermined sensitivity

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS11445134B2Solid-state imaging element and imaging device
Publication Date: 2022.09.13 SONY SEMICON SOLUTIONS CORP
  • US11445134B2 patent drawing
  • US11445134B2 patent drawing
  • US11445134B2 patent drawing

AI summary

Provided is a high-sensitivity-side transfer transistor that transfers a charge from a high-sensitivity photodiode having a sensitivity higher than a predetermined sensitivity to a first charge storage unit. A low-sensitivity-side transfer transistor that transfers a charge from a low-sensitivity photodiode having a sensitivity lower than the predetermined sensitivity to a second charge storage unit. An amplification transistor that amplifies a voltage of the first charge storage unit. A first conversion efficiency control transistor that controls conversion efficiency of converting the charge to the voltage by opening and closing a pathway between the first and second charge storage units. A second conversion efficiency control transistor that controls the conversion efficiency by opening and closing a pathway between the second charge storage unit and a third charge storage unit.