Imaging Jig Comparison Patterns for Uneven Texture Image Correction
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Solution Overview
Problem
Existing techniques for acquiring texture images face challenges such as the need for strict color management and difficulty in handling location-dependent uneven lighting, particularly in gamma curve correction.
Innovation Solution
A texture image acquisition apparatus and imaging jig that includes a light-transmissive window surrounded by comparison patterns with different tones, allowing for image capture and correction based on these patterns to extract accurate texture images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If gamma curve correction is applied to correct luminance, then imaging precision is improved, but location-dependent unevenness such as uneven lighting cannot be handled
Solution Approach 1:
The imaging jig is divided into multiple functional regions: a window portion for capturing the target object and multiple comparison pattern regions (first comparison pattern region, second comparison pattern region, third comparison pattern region) surrounding it. Each comparison pattern region has different tone characteristics that enable independent correction of specific imaging defects. This segmentation allows the system to address location-dependent issues by associating specific correction operations with specific spatial regions.
Solution Approach 2:
Different regions of the imaging jig are designed with different tone characteristics. The first comparison pattern region has a first tone, the second comparison pattern region has a second tone, and the third comparison pattern region has a third tone. This local differentiation enables the system to perform localized correction operations tailored to the specific imaging defects present in each region, such as correcting field angle distortion in one region while correcting luminance in another.
2Measurement precision
If strict color management is implemented, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The comparison pattern regions serve as intermediary elements that mediate between the captured image and the desired correction results. These patterns provide reference information about imaging defects (field angle distortion, luminance, contrast) without requiring complex color management systems. The correction unit uses these intermediary patterns to automatically determine correction parameters, simplifying the overall system while maintaining precision.
Solution Approach 2:
The imaging jig performs self-diagnosis and self-correction by incorporating comparison patterns that automatically reveal imaging defects. The correction unit processes the comparison pattern images to identify distortion and luminance issues, then applies corrections without requiring external calibration equipment or complex color management procedures. This self-service capability reduces system complexity while maintaining measurement precision.
Data Source
AI summary
An imaging jig includes a comparison pattern surrounding a window portion configured as a light-transmissive region having a predetermined shape and including at least a first region and a second region having different tones. By using the imaging jig, a capture image including a medium and the comparison pattern is captured while the imaging jig overlaps with the medium. From the captured image being captured, medium image data based on the image of the medium and comparison image data based on the image of the comparison pattern are acquired, and the medium image data is corrected based on image data relating to the first region and the second region that are included in the comparison image data. Then, an image of a texture of the medium is extracted from the medium image data being corrected.