Imaging-Based Light Emitter Array Testing System
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Solution Overview
Problem
Existing test systems for array-based light-emitting devices face challenges in accurately and efficiently characterizing both the full array and individual light emitters, particularly due to the limitations of integrating spheres, which are expensive, inefficient, and often unsuitable for large arrays, leading to low throughput and high costs.
Innovation Solution
A testing system that simultaneously energizes multiple light-emitting elements, captures their light emissions using an imaging system, and analyzes the images to determine optical and electrical characteristics, allowing for the identification of non-functional elements and collective device characteristics, while also providing a method to energize and test large arrays in a roll-to-roll process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If integrating spheres are used to characterize light emitters, then optical characteristics can be determined, but the system becomes expensive and throughput decreases
Solution Approach 1:
The patent divides the array into multiple zones that can be measured simultaneously using multiple sensors, rather than measuring the entire array through a single integrating sphere. This segmentation allows parallel measurement of different regions, significantly increasing throughput while maintaining measurement accuracy for each zone.
Solution Approach 2:
The patent replaces the mechanical integrating sphere system with an optical imaging system using cameras or sensors that capture light emissions directly. This substitution eliminates the need for physical sphere structures, reducing cost and enabling faster, non-contact measurement of large arrays.
2Quantity of substance
If large integrating spheres are used for very large arrays, then all light emitters can be measured simultaneously, but the system becomes insufficient and expensive
Solution Approach 1:
Instead of using one large integrating sphere, the patent segments the measurement system into multiple smaller sensors or camera units that can simultaneously measure different portions of a very large array. This approach maintains the ability to measure all light emitters while avoiding the complexity and cost of a single large sphere.
Solution Approach 2:
The patent employs imaging systems that can measure multiple zones simultaneously with a single setup, providing universal measurement capability across the entire array without requiring separate integrating spheres for each region. This multi-functional approach reduces overall system complexity.
3Adaptability or versatility
If arrays are curled or folded to fit into integrating spheres, then measurements can be performed, but manual handling is required and throughput decreases
Solution Approach 1:
The patent replaces mechanical handling and physical fitting of arrays into spheres with optical measurement systems that can capture images of arrays in their natural flat or flexible configurations. This substitution eliminates manual handling operations and enables continuous, high-speed measurement.
Solution Approach 2:
The patent transitions from three-dimensional integrating sphere measurements to two-dimensional optical imaging measurements. By capturing light emissions in a planar format, the system can measure flexible arrays without requiring them to be curled or folded into spherical shapes, thereby maintaining array integrity and improving throughput.
4Measurement precision
If integrating sphere measurements are performed, then optical characteristics are determined, but thermal equilibrium time is required and throughput is reduced
Solution Approach 1:
The patent replaces thermal-based integrating sphere measurements with optical imaging measurements that detect light emissions in real-time. This substitution eliminates the thermal equilibrium requirement, as optical sensors can immediately detect and record light output without waiting for thermal stabilization.
Solution Approach 2:
The patent employs rapid sequential imaging or continuous video capture to measure light emissions over time, allowing statistical analysis of optical characteristics without requiring thermal equilibrium. This periodic sampling approach achieves precise measurements in much shorter timeframes.
5Measurement precision
If individual light emitters are energized and measured separately, then detailed characterization is achieved, but additional wiring is required and cost increases
Solution Approach 1:
The patent uses optical imaging to create a visual map or copy of the array's light emission pattern, allowing individual emitter characteristics to be analyzed without physical access to each element. This optical copying approach eliminates the need for additional wiring while maintaining the ability to characterize individual emitters through image analysis.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-accuracy, high-throughput characterization of array-based light-emitting systems at a lower cost by enabling simultaneous measurement of multiple elements, improving efficiency and reducing the need for extensive calibration and thermal equilibration times.
Implementation Method 1
light-emitting elements of such devices are evaluated substantially simultaneously... light from the array of light-emitting elements may be captured, e.g., within an image of the light-emitting elements
Data Source
AI summary
In accordance with certain embodiments, multiple light-emitting elements of a light-emitting device are tested via imaging and image analysis.