Imaging System Reference Pattern Alignment for 3D Model Precision

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Solution Overview

Problem

Existing imaging systems face challenges in associating information from different fields of view with high precision, particularly when the correspondence between them is insufficient, leading to difficulties in integrating three-dimensional shape data accurately.

Innovation Solution

The proposed imaging system employs a first and second imager, each projecting and detecting a reference pattern on an object, allowing for the calculation of shape and texture information, and using pattern extraction to establish precise correspondence between the data from both imagers, enabling accurate integration of three-dimensional model information.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If multiple fields of view are used to acquire three-dimensional shape information, then the coverage area is improved, but the precision of associating information between fields of view deteriorates

Engineering Contradiction:
Improvecoverage areaVSAvoidprecision of associating information
Core Design Contradiction:
Area of stationary objectVSMeasurement precision

Solution Approach 1:

A reference pattern is introduced as an intermediary element that is projected onto the object and detected by multiple imagers. This reference pattern serves as a common mediator that enables precise association between different fields of view, solving the problem of information correspondence while maintaining multi-area coverage

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The reference pattern is copied and projected onto different regions of the object visible to different imagers. By detecting this copied reference pattern in multiple fields of view, the system establishes precise correspondence relationships without requiring direct feature matching between disparate views

Inventive Principle:
Principle #26Copying

2Manufacturing precision

If reference pattern projection is used to associate information between fields of view, then the precision of three-dimensional model integration is improved, but the device complexity increases

Engineering Contradiction:
Improveprecision of three-dimensional model integrationVSAvoiddevice complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The reference pattern projection system serves multiple functions: it provides positioning information, establishes correspondence between fields of view, and enables three-dimensional model integration. This multi-functionality reduces the need for separate systems for each task, thereby limiting the increase in device complexity

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The system changes the parameter of using projected light patterns instead of relying on natural object features. This parameter change simplifies the association process while maintaining high precision, balancing the trade-off between improved integration accuracy and increased device complexity

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10638113B2Imaging system, imaging device, method of imaging, and storage medium
Publication Date: 2020.04.28 NIKON CORP
  • US10638113B2 patent drawing
  • US10638113B2 patent drawing
  • US10638113B2 patent drawing

AI summary

An imaging system, including: a first body; a first imager that is provided in the first body and images an object; a first information calculator that is provided in the first body and calculates first model information including at least one of shape information and texture information of the object based on an imaging result of the first imager; a pattern setter that sets a reference pattern indicating at least a part of the first model information calculated by the first information calculator; a first projector that projects the reference pattern toward the object; a second body; a second imager that is provided in the second body and images the object onto which the reference pattern is projected; a second information calculator that is provided in the second body and calculates second model information including at least one of shape information and texture information of the object based on an imaging result of the second imager; and a pattern extractor that extracts the reference pattern projected by the first projector from the imaging result of the second imager.