Imaging Sensor Voltage Supply Line Segmentation for Failure Detection
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Solution Overview
Problem
Existing imaging sensors face challenges in reliable failure detection due to potential short-circuit issues between voltage supply lines, which can lead to incorrect potential readings and reduced detection accuracy, especially in harsh environments like vehicles.
Innovation Solution
The imaging sensor employs a configuration with separate voltage supply lines for failure detecting pixels, using switches to control potential application during shutter scanning, preventing short-circuits and enhancing detection accuracy by maintaining distinct voltage levels for effective pixel operation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate voltage supply lines are used for failure detecting pixels, then failure detection accuracy is improved, but device complexity increases
Solution Approach 1:
The voltage supply lines are segmented into separate first and second lines, with each line supplying voltage to specific subsets of pixels. The first voltage supply line supplies first potential to first detection pixels, while the second voltage supply line supplies second potential to second detection pixels. This segmentation prevents short-circuits between adjacent voltage supply lines and enables accurate failure detection by maintaining distinct voltage levels for different pixel groups.
2Area of stationary object
If voltage supply lines are placed close together to reduce area, then manufacturing area is reduced, but short-circuit risk increases
Solution Approach 1:
The patent introduces a vertical dimension to the line interval measurement by specifying that the interval between first and second voltage supply lines is longer than the interval between adjacent lines of the same type. This dimensional differentiation creates additional spatial separation between potentially short-circuiting lines while maintaining compact overall layout, effectively using three-dimensional spatial arrangement to resolve the area versus reliability contradiction.
Data Source
AI summary
A third line that supplies a first potential to a first semiconductor region of a first detection pixel and a fourth line that supplies a second potential to the first semiconductor region of a second detection pixel are provided. An interval between a partial line of the third line and a partial line of the fourth line is longer than an interval between a partial line of a first line and a partial line of a second line which extend along the partial line of the third line and the partial line of the fourth line.