Imaging System Real-Time Digital Testing

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Solution Overview

Problem

Conventional imaging systems lack real-time testing and verification capabilities for image processing blocks, which are crucial for ensuring optimal functionality, especially in critical applications like autonomous vehicle control, where infrequent offline testing is inadequate.

Innovation Solution

Incorporating real-time digital testing and verification mechanisms within the imaging system, utilizing test patterns generated by test pattern generators to process data through image processing blocks, allowing for continuous verification of the imaging system's functionality during normal operations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If offline testing mode is used to verify image processing blocks, then device complexity is reduced, but testing frequency and real-time reliability are insufficient

Engineering Contradiction:
Improveimage processing block functionality verificationVSAvoidtesting system complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent merges the testing functionality with the normal imaging operations by integrating test pattern generators and verification circuits into the existing image processing pipeline. This allows testing to occur concurrently with normal operations without requiring separate dedicated testing hardware, thus improving reliability while controlling device complexity.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The patent enables continuous testing during normal imaging operations by generating test patterns continuously alongside actual image data. The image processing blocks process both real image data and test patterns through the same pipeline, ensuring uninterrupted verification of functionality without halting operations, thereby maintaining continuous reliability assurance.

Inventive Principle:
Principle #20Continuity of useful action

2Reliability

If real-time testing is implemented continuously, then reliability is improved, but use of energy and device complexity increase

Engineering Contradiction:
Improvecontinuous functionality verificationVSAvoidenergy consumption for testing
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent designs the testing system to share existing imaging resources such as the image processing blocks, data buses, and output interfaces. The same processing blocks that handle real image data are used to process test patterns, and the same output interfaces display both real images and test patterns. This multi-functionality approach enables continuous testing without requiring dedicated energy-consuming testing hardware.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent implements testing at appropriate intervals and selectively processes test patterns through subsets of image processing blocks based on verification needs. Rather than continuously testing all blocks at full capacity, the system performs partial testing only when necessary, reducing overall energy consumption while maintaining adequate reliability verification.

Inventive Principle:
Principle #16Partial or excessive action

3Reliability

If test patterns are generated and processed through image processing blocks, then functionality verification is achieved, but processing time and productivity are affected

Engineering Contradiction:
Improveimage processing block verificationVSAvoidimaging data processing throughput
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The patent implements periodic testing where test patterns are generated and processed at specific intervals rather than continuously for every frame. The system alternates between processing real image data and test patterns, allowing the imaging system to maintain high productivity during normal operations while periodically verifying functionality to ensure reliability.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent segments the testing process into separate test pattern generation, processing, and verification stages that can be executed independently from the main imaging pipeline. Test patterns are generated in dedicated test rows or columns that are processed separately from real image data, allowing verification without blocking the main productivity-critical imaging operations.

Inventive Principle:
Principle #1Segmentation

4Measurement precision

If digital test row data is integrated into the imaging system, then measurement precision of processing block functionality is improved, but device complexity and ease of operation worsen

Engineering Contradiction:
Improveprocessing block functionality verification accuracyVSAvoidsystem operation simplicity
Core Design Contradiction:
Measurement precisionVSEase of operation

Solution Approach 1:

The patent incorporates feedback mechanisms where the results of test pattern processing are automatically compared against expected outcomes. The system generates test patterns, processes them through image processing blocks, and automatically verifies the results by comparing with predetermined reference values. This automated feedback loop provides precise functionality verification while shielding users from the complexity of manual testing procedures.

Inventive Principle:
Principle #23Feedback

Data Source

PatentUS9843794B2Imaging systems with real-time digital testing capabilities
Publication Date: 2017.12.12 SEMICON COMPONENTS IND LLC
  • US9843794B2 patent drawing
  • US9843794B2 patent drawing
  • US9843794B2 patent drawing

AI summary

An imaging system with real-time digital testing capabilities verifies the functionality of image processing circuitry used to process pixel data signals read out from a pixel array during imaging operations. Image processing circuitry may process a data frame read from an imaging array that includes multiple regions of imaging and non-imaging data. Digital test patterns may be generated to test the functionality of specific image processing blocks. Test patterns may correspond to or represent imaging data or non-imaging data from regions of the output readout frame. A checksum generator generates a test pattern checksum for output of a subset of the image processing blocks that were provided with a given test pattern. The test pattern checksum may be compared to a predetermined checksum of the output of properly functioning image processing blocks provided with test patterns equivalent to the given test pattern.