Solid-State Imaging Device Wiring Disconnection Correction

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Solution Overview

Problem

Conventional solid-state imaging devices experience defective lines when a row selecting wiring disconnects, leading to charge overflow and reduced image resolution, especially in large-area photodetecting sections where disconnections are more likely, and existing correction methods lower resolution near defective lines.

Innovation Solution

A solid-state imaging device with a correction processing section that uses a polynomial function expression based on incident light intensity dependencies to correct frame data, allowing for high-resolution image generation even when row selecting wirings are disconnected, by interpolating voltage values without relying on normal line data.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the photodetecting section area is increased to improve imaging coverage, then the imaging area is improved, but the wiring disconnection probability increases

Engineering Contradiction:
Improvephotodetecting section areaVSAvoidwiring connection reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The invention performs preliminary detection of wiring disconnections and pre-calculates correction coefficients based on polynomial functions before image acquisition. By preparing correction data in advance and storing it in a lookup table, the system can quickly compensate for wiring disconnections during operation without degrading image quality, thus maintaining reliability while using large-area photodetecting sections.

Inventive Principle:
Principle #10Preliminary action

2Device complexity

If simple averaging interpolation is used for defective line correction, then the correction process is simple, but the image resolution near defective lines deteriorates

Engineering Contradiction:
Improvecorrection processing complexityVSAvoidimage resolution
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The invention changes the correction parameter from simple averaging to polynomial function-based correction. By using predetermined polynomial functions with calculated coefficients that account for the specific relationship between defective and normal lines, the method achieves higher precision correction while maintaining computational efficiency through pre-calculated lookup tables, thus improving image resolution without excessive complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enables high-resolution image acquisition by accurately correcting pixel data near defective lines, preventing charge overflow and maintaining image quality even with disconnected row selecting wirings, particularly in large-area photodetecting sections.

Implementation Method 1

a photodiode for generating charges of an amount corresponding to an incident light intensity

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentEP2242254B1Solid-state imaging device and frame data correcting method
Publication Date: 2015.08.26 HAMAMATSU PHOTONICS KK
  • EP2242254B1 patent drawingFigure 1
  • EP2242254B1 patent drawingFigure 2
  • EP2242254B1 patent drawingFigure 3

AI summary

The present invention relates to a solid-state imaging device, etc., having a structure which enables to obtain an image with higher resolution by correcting pixel data even when any one of row selecting wirings is disconnected. A solid-state imaging device (1) comprises a photodetecting section (10), a signal reading-out section (20), a controlling section (30), and a correction processing section (40). The photodetecting section (10) has M×N pixel portions P1,1 to PM,N two-dimensionally arrayed in M rows and N columns, and each of the pixel portions P1,1 to PM,N includes a photodiode which generates charges of an amount corresponding to an incident light intensity and a reading-out switch connected to the photodiode. Charges generated in each of the pixel portions P1,1 to PM,N are inputted into an integrating circuit Sn through a reading-out wiring LO,n. A voltage value outputted from the integrating circuit Sn corresponding to the amount of inputted charges is outputted to an output wiring Lout through a holding circuit Hn. The correction processing section (40) applies correction processing to frame data repeatedly outputted from the signal reading-out section (20), and then outputs the frame data after correction processing.