Immersion Lithography Barrier Layer for Defect Reduction

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Immersion lithography faces challenges in achieving smaller feature dimensions and tighter pitches due to limitations in lithographic processes, particularly with immersion-related defects and degraded aerial image contrast.

Innovation Solution

Incorporating a hydrophobic and contrast-enhancing barrier layer between the immersion liquid film and the photo-resist layer, which can be formed by depositing a fluoro-carbon and acrylate chromophore layer or by migrating barrier-forming components from the photo-resist layer, to prevent defects and enhance image contrast.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If immersion lithography is used to achieve smaller feature dimensions and tighter pitches, then manufacturing precision is improved, but immersion-related defects and degraded aerial image contrast occur

Engineering Contradiction:
Improvefeature dimension and pitchVSAvoidimmersion-related defects and degraded aerial image contrast
Core Design Contradiction:
Manufacturing precisionVSObject-affected harmful factors

Solution Approach 1:

A barrier layer is introduced as an intermediary component between the immersion liquid film and the photo-resist layer. This barrier layer mediates the interaction between the immersion liquid and photo-resist, preventing harmful effects such as defects and contrast degradation while maintaining the benefits of immersion lithography for achieving smaller feature dimensions and tighter pitches.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The barrier layer is applied specifically at the interface between the immersion liquid and photo-resist, where the harmful interactions occur. This localized application addresses the immersion-related defects and contrast issues at the critical interface without affecting other areas of the lithographic system, thereby maintaining manufacturing precision while eliminating harmful factors.

Inventive Principle:
Principle #3Local quality

2Illumination intensity

If a barrier layer is added to prevent immersion-related defects and enhance contrast, then aerial image contrast is improved, but device complexity increases

Engineering Contradiction:
Improveaerial image contrastVSAvoidlithographic process structure
Core Design Contradiction:
Illumination intensityVSDevice complexity

Solution Approach 1:

The barrier layer is implemented as a thin film structure that can be deposited or formed on the photo-resist layer. This thin film approach enhances aerial image contrast by preventing immersion liquid interaction with the photo-resist, while minimizing the increase in device complexity through the use of a relatively simple, thin-layer structure rather than a bulky or complex system modification.

Inventive Principle:
Principle #30Flexible shells and thin films

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The hydrophobic and contrast-enhancing barrier layer reduces immersion-related defects and improves the contrast of the aerial image, enabling more precise patterning and reducing leaching of resist components, thus enhancing the overall performance of immersion lithography.

Implementation Method 1

a hydrophobic and contrast-enhancing barrier layer is used between an immersion liquid film and a photo-resist layer

Methodology Applied
Scientific EffectHydrophobe: Hydrophobe

Implementation Method 2

forming a layer composed of a fluoro-carbon and an acrylate chromophore

Methodology Applied
Scientific EffectAbsorption (EM radiation): Absorption (EM radiation)

Data Source

PatentUS7704674B1Method for patterning a photo-resist in an immersion lithography process
Publication Date: 2010.04.27 MICRON TECHNOLOGY INC
  • US7704674B1 patent drawing
  • US7704674B1 patent drawing
  • US7704674B1 patent drawing

AI summary

A method for patterning a photo-resist in an immersion lithography process is described. The method includes forming a photo-resist layer above a substrate. A hydrophobic and contrast-enhancing barrier layer is formed above the photo-resist layer. The photo-resist layer is exposed, through the hydrophobic and contrast-enhancing barrier layer, to a light source. The photo-resist layer is developed to provide a patterned photo-resist layer.