Immersion Lithography Overcoating Composition for Photoresist Migration Control

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Solution Overview

Problem

Current immersion lithography systems lack reliable and convenient photoresist and imaging processes, and there is a need for new materials and processes to achieve smaller feature sizes in semiconductor manufacturing driven by Moore's law.

Innovation Solution

Development of overcoating compositions comprising copolymers or terpolymers with hydrophilic groups and reactive moieties, applied above a photoresist layer, which inhibit the migration of photoresist components into immersion fluids and enhance lithographic performance by reducing acid or organic material in the immersion fluid, thereby improving resolution and pattern transfer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Manufacturing precision

If immersion lithography is used to increase numerical aperture and achieve smaller feature sizes, then resolution is improved, but photoresist components migrate into the immersion fluid causing contamination and process reliability deterioration

Engineering Contradiction:
Improvefeature sizeVSAvoidprocess reliability
Core Design Contradiction:
Manufacturing precisionVSReliability

Solution Approach 1:

A top coat layer is introduced as an intermediary barrier between the photoresist and the immersion fluid. This top coat prevents photoresist components from migrating into the immersion fluid while allowing the immersion lithography process to proceed with improved resolution. The top coat acts as a protective mediator that maintains process reliability without compromising the resolution benefits of immersion lithography.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The photoresist system is segmented into multiple functional layers: the base photoresist layer for pattern formation and a top coat layer for protection and fluid barrier functions. This segmentation allows each layer to be optimized independently - the photoresist for sensitivity and pattern fidelity, and the top coat for preventing contamination of the immersion fluid.

Inventive Principle:
Principle #1Segmentation

2Manufacturing precision

If shorter wavelengths of light are used to achieve smaller feature sizes, then resolution is improved, but material transparency becomes difficult to obtain below 193 nm

Engineering Contradiction:
Improvefeature sizeVSAvoidmaterial availability
Core Design Contradiction:
Manufacturing precisionVSEase of manufacture

Solution Approach 1:

The top coat serves as an intermediary protective layer that enables the use of 193 nm wavelength light by preventing photoresist degradation and contamination of the immersion fluid. This allows the system to operate at the practical wavelength limit where materials are still available and transparent, without requiring shorter wavelengths that would demand materials below 193 nm.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The system changes the chemical composition parameters of the top coat layer to achieve optimal transparency at 193 nm wavelength while maintaining barrier properties. By carefully selecting polymers and additives with appropriate molecular structures and functional groups, the top coat achieves both optical transparency and protective functionality.

Inventive Principle:
Principle #35Parameter changes

3Reliability

If a top coat layer is applied to prevent photoresist migration into immersion fluid, then process reliability is improved, but additional processing steps and material complexity are introduced

Engineering Contradiction:
Improveprocess reliabilityVSAvoidlayer structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The top coat is formulated as a homogeneous solution containing specific polymers (such as polyhydroxystyrene or carboxy-containing polymers) and additives in controlled concentrations. This homogeneous composition ensures uniform application and consistent protective properties across the entire photoresist layer, simplifying the coating process and ensuring reliable performance.

Inventive Principle:
Principle #33Homogeneity

Solution Approach 2:

The top coat utilizes composite material science by combining multiple functional components - polymers for structural integrity and barrier properties, surfactants for wetting and uniform coating, and other additives for optimized performance. This composite approach achieves multiple functions in a single layer, reducing the need for additional separate processing steps.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The overcoating compositions effectively reduce the amount of photoresist material in the immersion fluid, leading to improved resolution and pattern transfer in immersion lithography, enabling the use of sub-300 nm wavelengths and facilitating the production of microelectronic devices with smaller feature sizes.

Implementation Method 1

The overcoating compositions effectively reduce the amount of photoresist material in the immersion fluid

Methodology Applied
Scientific EffectAdsorption: Adsorption

Implementation Method 2

The overcoating compositions effectively reduce the amount of photoresist material in the immersion fluid

Methodology Applied
Scientific EffectAbsorption: Absorption (physical)

Implementation Method 3

Immersion lithography employs a relatively high refractive index fluid between the last surface of an imaging device and the first surface on a wafer to focus more light into the film

Methodology Applied
Scientific EffectRefraction: Refraction

Data Source

PatentUS8012666B2Compositions and processes for photolithography
Publication Date: 2011.09.06 DUPONT ELECTRONIC MATERIALS INT LLC
  • US8012666B2 patent drawing
  • US8012666B2 patent drawing
  • US8012666B2 patent drawing

AI summary

Overcoating layer compositions are provided that are applied above a photoresist composition including for immersion lithography processing as well as non-immersion imaging.