Impedance Measurement Circuit Using Equivalent-Time Sampling

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Solution Overview

Problem

Existing power impedance measurement (PIM) circuits in high-performance computing (HPC) systems require lengthy testing times due to the deliberate slowdown of digital components, leading to inefficiencies in power delivery network (PDN) testing.

Innovation Solution

An impedance measurement circuit utilizing equivalent-time sampling (ETS) with edge samplers and accumulators activated by sampling clock signals of the same frequency, allowing for faster and accurate PDN profiling through sequential sampling and accumulation of power voltage signals.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If digital components are deliberately slowed down for accurate impedance measurement, then measurement precision is improved, but testing time increases

Engineering Contradiction:
Improveimpedance measurement accuracyVSAvoidtesting time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent employs periodic sampling of the power delivery network using a sampling clock signal that operates at a different frequency than the PDN excitation signal. By periodically sampling the voltage response at specific phases and accumulating multiple samples, the circuit achieves accurate impedance measurement without requiring the entire measurement process to run at reduced speed, thus resolving the contradiction between precision and testing time.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent performs preliminary phase alignment between the sampling clock signal and the PDN excitation signal before actual impedance measurement. By pre-synchronizing the sampling phases and using phase-locked loops to establish proper timing relationships, the system ensures that subsequent measurements can be conducted at full speed without compromising accuracy, thereby reducing overall testing time while maintaining precision.

Inventive Principle:
Principle #10Preliminary action

2Productivity

If sampling frequency is increased for faster PDN profiling, then productivity is improved, but measurement precision deteriorates

Engineering Contradiction:
ImprovePDN profiling speedVSAvoidimpedance measurement accuracy
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent uses periodic sampling at optimized phases rather than continuous high-speed sampling. By strategically selecting sampling instants that correspond to specific phases of the PDN excitation cycle and accumulating multiple periodic samples, the system achieves both high productivity through faster overall profiling and maintained precision through proper phase-aligned sampling that captures the essential impedance characteristics.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent performs preliminary frequency synchronization and phase alignment between the sampling clock and PDN excitation signals. This preliminary action ensures that even when sampling at higher frequencies for faster profiling, the critical impedance information is captured at the correct phases, preventing precision deterioration while achieving improved productivity through faster accumulation of sufficient samples.

Inventive Principle:
Principle #10Preliminary action

Data Source

PatentUS20250370018A1Impedance measurement circuits and methods for operating the same
Publication Date: 2025.12.04 TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
  • US20250370018A1 patent drawing
  • US20250370018A1 patent drawing
  • US20250370018A1 patent drawing

AI summary

An impedance measurement circuit includes a voltage controlled oscillator (VCO) configured to generate an oscillation signal according to a power voltage present on a power rail. The impedance measurement circuit includes an edge sampler coupled to the VCO and configured to generate a first signal sampling the oscillation signal based on a first transition edge of a first sampling clock signal. The impedance measurement circuit includes an accumulator coupled to the edge sampler and configured to accumulate the first signal for generating a second signal based on a third transition edge of a second sampling clock signal. The impedance measurement circuit includes a transition detector configured to generate the second sampling clock signal based on detecting a second transition edge of the first sampling clock signal.