Impedance Synthesizer Using FPGA Clock Synchronization
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Impedance characterization of devices under test is a time-consuming process due to the limitations in the speed of impedance tuners, which hinder the exploitation of fast tuning technologies when combined with signal generation and data acquisition systems.
Innovation Solution
A system for impedance synthesis as a function of time, utilizing an externally applied clock signal to generate parameters that control the impedance tuner, allowing for rapid impedance changes, similar to an arbitrary waveform generator, and integrating this with signal generation and data acquisition means using field programmable gate arrays (FPGAs) for synchronization.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional impedance tuners are used for device characterization, then impedance control is achieved, but the characterization process becomes time-consuming
Solution Approach 1:
The patent implements dynamic impedance tuning by replacing static mechanical tuners with electronically controlled variable impedance elements (varactors, FETs, or FPGAs) that can rapidly change impedance values in response to control signals, enabling fast sweeping through impedance space without mechanical movement delays
Solution Approach 2:
The patent substitutes mechanical impedance tuning mechanisms (movable shorts, open circuits, or mechanical tuners) with electronic impedance synthesis using voltage-controlled components such as varactor diodes, FETs, or digitally controlled FPGAs that generate variable impedance through electrical signals, eliminating mechanical inertia and positioning delays
2Productivity
If fast tuning technologies are used, then characterization speed increases, but integration with signal generation and data acquisition becomes complex
Solution Approach 1:
The patent combines the impedance tuning function with the signal generation and data acquisition system into a unified measurement platform, where the impedance tuner, signal source, and detector operate under coordinated control, allowing simultaneous impedance sweeping and device characterization without separate control loops
Solution Approach 2:
The patent implements a multi-functional measurement system where a single integrated platform performs impedance synthesis, signal generation, device under test stimulation, and response measurement, eliminating the need for separate specialized equipment and simplifying the overall system architecture despite the advanced capabilities
Data Source
AI summary
The present invention relates to a system for impedance generation comprisingimpedance generation means arranged for receiving an input clock signal and for generating at least one parameter at a frequency derived from the input clock signal,impedance tuning means arranged for receiving the at least one parameter, for synthesizing an impedance based on the received at least one parameter and for outputting the synthesized impedance to a device under test.