Imprint Defect Detection Using Inference Model

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

The existing imprint techniques face challenges in efficiently detecting and distinguishing between extrusion and unfilling defects during the pattern formation process on substrates, which are critical for producing high-quality microstructured devices.

Innovation Solution

An evaluation apparatus that processes images of the formed composition on a substrate to detect abnormalities using an inference model, determining the type and location of defects, and automatically classifying images as normal or abnormal.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If manual inspection of observation images is performed to detect extrusion and unfilling defects, then detection accuracy can be maintained, but inspection time and labor cost increase significantly

Engineering Contradiction:
Improvedefect detection accuracyVSAvoidinspection time
Core Design Contradiction:
Measurement precisionVSLoss of time

Solution Approach 1:

The patent replaces manual mechanical inspection with an automated image processing system that uses computer algorithms to detect and classify defects. The system automatically analyzes observation images to identify extrusion and unfilling defects, eliminating the need for manual inspection while maintaining detection accuracy and significantly reducing inspection time.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent introduces an image processing system as an intermediary between the imprint process and quality assessment. This intermediary system captures observation images, processes them through automated algorithms, and provides defect detection results, serving as a bridge that eliminates direct manual inspection while preserving quality control.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If high-powered microscope is used to obtain detailed observation images for defect detection, then measurement precision improves, but the observation range becomes narrow requiring more images to be checked

Engineering Contradiction:
Improvedefect detection capabilityVSAvoidobservation range
Core Design Contradiction:
Measurement precisionVSArea of stationary object

Solution Approach 1:

The patent segments the inspection task into multiple observation images that collectively cover the entire shot region. By dividing the large-area inspection into smaller, manageable image segments and processing them automatically, the system achieves both high detection precision and complete area coverage without requiring manual inspection of numerous images.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from manual two-dimensional image inspection to automated multi-dimensional processing by combining multiple observation images into a comprehensive analysis. The system processes images in a systematic manner across different regions and depths, effectively expanding the observation range while maintaining precision through automated algorithms.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

3Reliability

If multiple observation images are captured to cover the entire shot region, then complete defect detection is achieved, but the complexity of processing and analyzing the images increases

Engineering Contradiction:
Improvedefect detection completenessVSAvoidimage processing complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent employs a universal image processing system that handles multiple functions including image capture, processing, defect detection, and classification across all observation images. This multi-functional system simplifies the overall complexity by providing a unified approach to handle the entire inspection workflow rather than separate specialized processes for each task.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The image processing system performs self-service by automatically analyzing observation images without requiring manual intervention. The automated algorithms independently detect defects, classify them as extrusion or unfilling, and generate inspection results, thereby reducing processing complexity and eliminating the need for complex manual analysis procedures.

Inventive Principle:
Principle #25Self-service

4Manufacturing precision

If various types of formation defects are detected and classified, then quality control improves, but the complexity of distinguishing and processing different defect types increases

Engineering Contradiction:
Improvepattern formation qualityVSAvoiddefect classification complexity
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality analysis by detecting and classifying defects based on their specific characteristics and locations within the pattern. The system identifies different defect types (extrusion, unfilling) and their positions, providing localized quality assessment that improves manufacturing precision without requiring complex global analysis of all defects simultaneously.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent uses parameter changes in the image processing algorithms to automatically distinguish between different defect types. By varying analysis parameters such as shape characteristics, size thresholds, and positional relationships, the system efficiently classifies defects without requiring complex manual differentiation procedures, thereby improving quality control while managing processing complexity.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables efficient detection and classification of extrusion and unfilling defects, reducing manual effort and improving the quality of pattern formation by automating the evaluation process.

Implementation Method 1

a processing device configured to process the obtained image for the evaluation

Methodology Applied
Scientific EffectImage processing: Image Processing

Data Source

PatentUS12293505B2Evaluation apparatus, computer-readable storage medium, evaluation method, forming system, and article manufacturing method
Publication Date: 2025.05.06 CANON KK
  • US12293505B2 patent drawing
  • US12293505B2 patent drawing
  • US12293505B2 patent drawing

AI summary

An evaluation apparatus that evaluates a composition formed on a substrate by forming processing is provided. The apparatus comprises an obtaining device that obtains an image including the composition by the forming processing, and a processing device that processes the image for the evaluation. The processing device outputs a feature of each of one or more abnormalities in the image according to an inference model, obtains information regarding a formation region on the substrate where the composition has been formed, determines the kind of each of the abnormalities based on the output feature of each of the abnormalities and a relationship between the information and a position and a size of the abnormality, and makes, based on a result of the determination, final determination as to whether the image is a normal image or an image including an abnormality.