In-cell touch panel transient lead wiring for voltage testing
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Solution Overview
Problem
The existing in-cell touch panel voltage testing method is cumbersome and inaccurate due to the difficulty in aligning test boards with the small and closely spaced touch pins, requiring cumbersome fixtures and low testing accuracy.
Innovation Solution
The implementation of first wires on transient leads connected to touch pins, allowing for grouping of adjacent pins for simultaneous testing and using wider wires at the outermost ends for easier alignment, along with separate test boards for touch and display pins to improve testing convenience and accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of moving object
If touch pins are made small and closely spaced to reduce panel size, then panel size is reduced, but testing alignment difficulty increases and testing accuracy decreases
Solution Approach 1:
The patent introduces a test board with detection portions that act as intermediaries between the testing equipment and the touch pins. The detection portions are designed to correspond one-to-one with touch pins and are positioned to contact only the intended touch pin during testing, thereby enabling accurate testing despite the small size and close spacing of the pins.
Solution Approach 2:
The test board is segmented into multiple detection portions, each corresponding to a specific touch pin. This segmentation allows for individualized testing of each pin while maintaining the overall compact panel design, as each detection portion can be precisely aligned with its corresponding pin.
2Ease of operation
If touch pins are widened to simplify testing, then testing alignment becomes easier, but panel size increases due to larger pin width and spacing
Solution Approach 1:
The patent moves the alignment reference from the pin itself to the test board structure. The detection portions on the test board are designed with sufficient spacing and clear boundaries, providing an easier alignment target in the testing dimension without increasing the pin size on the panel.
3Measurement precision
If separate test boards are used for each touch pin, then testing accuracy improves, but device complexity increases due to multiple test boards and fixtures
Solution Approach 1:
The patent combines multiple detection portions for different touch pins onto a single test board. The test board integrates multiple detection portions, each corresponding to a specific touch pin, allowing simultaneous testing of multiple pins with one fixture rather than requiring separate fixtures for each pin.
4Productivity
If detection portions contact multiple pins simultaneously, then testing speed increases, but short circuit risks increase due to improper contact
Solution Approach 1:
The detection portions are designed with specific contact areas that correspond precisely to individual touch pins. Each detection portion has a localized contact region that ensures contact with only the intended pin, preventing short circuits while enabling efficient parallel testing of multiple pins.
Data Source
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AI summary
An in-cell touch panel is provided. The in-cell touch panel includes: an array substrate; a plurality of signal lines arranged at one side of the array substrate, the signal line including a transient lead, and a display pin and a touch pin connected with the transient lead; an insulating layer covering the transient lead; and a first wire formed on the insulating layer covering the transient lead, wherein the first wire is electrically connected with the transient lead via a first through-hole in the insulating layer. By the in-cell touch panel structure according to the invention, the difficulty in voltage testing for pins may be reduced and the testing accuracy may be improved.