In-Field Image Quality Testing for Solid-State Imagers
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Solution Overview
Problem
Existing solid-state imaging systems lack a practical method for field-testing image quality, leading to extended downtime and complex procedures for maintenance personnel to assess resolution, illumination consistency, and modulation transfer function, often requiring specialized software and equipment.
Innovation Solution
Incorporating a test pattern and a test program within the imaging system's controller to automatically or manually enter a test mode, allowing for in-situ testing of image quality, with results presented visually or auditorily, minimizing downtime and eliminating the need for external testing software.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If external testing software and equipment are used to test image quality, then measurement precision is improved, but device complexity and ease of operation worsen
Solution Approach 1:
The patent combines the testing functionality directly into the imaging system by integrating a test pattern display device and test program storage into the same housing as the imager. This merging eliminates the need for separate external testing equipment while maintaining measurement precision through built-in test patterns and automated evaluation algorithms.
Solution Approach 2:
The imaging system is designed to perform both normal imaging operations and self-testing functions using the same hardware components. The controller can switch between capturing actual images and displaying test patterns, allowing the system to serve multiple purposes without requiring additional specialized equipment.
2Measurement precision
If external testing software and equipment are used to test image quality, then measurement precision is improved, but ease of operation worsens
Solution Approach 1:
The imaging system performs self-testing by automatically displaying test patterns through its own display device and evaluating the captured test images using stored test programs. The controller autonomously executes the test sequence, compares results against reference values, and determines pass/fail status without requiring external software or expert intervention.
Solution Approach 2:
The system provides immediate feedback on image quality by automatically processing test pattern captures and comparing them against reference images. The controller generates pass/fail indications that are readily available to the operator, eliminating the need for complex external analysis software and making the testing process straightforward.
3Measurement precision
If traditional testing methods are used, then measurement precision is maintained, but loss of time increases
Solution Approach 1:
The system performs self-testing during normal operation or between tasks without requiring extended shutdown periods. The test pattern display and image capture occur quickly using the existing imaging pipeline, allowing for rapid quality verification that minimizes disruption to workflow and reduces system downtime.
4Ease of operation
If built-in test mode is used, then ease of operation is improved, but device complexity increases
Solution Approach 1:
The testing components (test pattern display device, test program storage, and evaluation algorithms) are integrated into the same housing and controller as the imaging components. This consolidation adds functionality without requiring separate external equipment, making the system more self-contained while maintaining operational simplicity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables quick and accurate field testing of image quality, reducing system downtime and simplifying maintenance by providing immediate feedback on whether the imaging system meets specifications, facilitating timely repairs or replacements.
Implementation Method 1
an imager operative for capturing return light from a test pattern
Data Source
AI summary
An imaging system with in-field image quality testing and reporting features, includes a housing, and a solid-state imager having an array of image sensors supported by the housing for capturing return light from a target located in a range of working distances from the housing in an image capture mode of operation, and for capturing return light from a test pattern positioned at a predetermined position in the range of working distances in a test mode of operation different from the image capture mode. An electrical signal indicative of the captured return light is generated in each mode. A memory is supported by the housing for storing a test program for testing image quality. A controller is supported by the housing for processing the electrical signal in the image capture mode, and for accessing the memory to enable the controller to execute the test program in the test mode to test the image quality of the test pattern imaged by the imaging system, and for reporting test results of the image quality of the test pattern.