In-process Material Characterization via Electromagnetic Field Analysis
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional methods for quality control and quality assurance during manufacturing processes fail to provide non-destructive, in-process inspection of material properties, often requiring direct electrical contact or using radioactive materials that pose environmental and national security risks.
Innovation Solution
A system utilizing an array of non-conductive electrodes to transmit oscillating electromagnetic field signals and determine material characteristics by comparing return signals with predetermined thresholds, employing impedance spectrographic tomography for real-time, non-destructive inspection of specified layers or volumes of materials.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional inspection methods are used, then material properties can be inspected, but direct electrical contact or radioactive materials are required which pose environmental and security risks
Solution Approach 1:
The patent replaces conventional mechanical or contact-based inspection methods with electromagnetic field-based inspection. The system uses oscillating electromagnetic fields generated by electrodes to characterize material properties without direct electrical contact or radioactive materials, thereby eliminating environmental and security risks while maintaining inspection reliability
Solution Approach 2:
The patent introduces electromagnetic fields as an intermediary between the inspection system and the material. The oscillating electromagnetic fields interact with the material's dielectric properties to provide characterization data without requiring direct contact or hazardous substances, resolving the contradiction between reliable inspection and harmful factors
2Reliability
If non-destructive inspection is performed, then material integrity is maintained, but real-time in-process inspection capability is limited
Solution Approach 1:
The patent enables continuous real-time inspection during the manufacturing process by using oscillating electromagnetic fields that can continuously interact with the material as it is being formed. The system provides ongoing feedback without interrupting the manufacturing process, maintaining both material integrity and productivity
Solution Approach 2:
The inspection system performs characterization during the manufacturing process itself, allowing for real-time detection of material properties before defects develop. This preliminary detection capability enables immediate process adjustments while maintaining material integrity through non-destructive measurement
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables real-time, non-destructive, and in-process inspection of material properties, overcoming the limitations of conventional methods by avoiding direct electrical contact and radioactive materials, thereby enhancing manufacturing process control and reducing scrap rates.
Implementation Method 1
a signal generator for transmitting oscillating electromagnetic field signals from the array of electrodes at a range of frequencies
Implementation Method 2
obtain a return signal from the array of electrodes about the MUT; compare the return signal with the oscillating electromagnetic field signals to determine a difference
Data Source
AI summary
Various embodiments include solutions for in-process material characterization. Various particular embodiments include a computer-implemented method including: providing instructions for transmitting oscillating electromagnetic field signals to a material under test (MUT); obtaining a return signal associated with the transmitted oscillating electromagnetic field signals; comparing the return signal with the oscillating electromagnetic field signals to determine a difference in an aspect of the return signal and the aspect of the oscillating electromagnetic field signals; comparing the difference in the aspect to a predetermined threshold; and determining a characteristic of the MUT based upon the compared difference.