In-Socket RF Calibration Probe Assembly for Accurate Pin Power
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Solution Overview
Problem
Existing DUT testing systems fail to accurately measure RF power delivered to socket pins due to signal losses in the loadboard PCB trace and socket, and lack the capability to perform internal loopback testing for devices with multiple antennas or self-testing functionality.
Innovation Solution
An in-socket calibration probe assembly that integrates directly into a device socket, utilizing controllable switches and coaxial cables to precisely measure RF power at socket pins, enabling accurate power delivery determination through de-embedding factors and loopback paths for internal testing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If generalized tester systems are used to calibrate signal pathway up to tester pogo pins, then calibration can be performed for the signal pathway leading up to the tester pogo pins, but the signal path through the loadboard to the device socket pins cannot be calibrated or characterized
Solution Approach 1:
The invention divides the signal path into separable segments: the loadboard PCB trace segment and the socket segment. By inserting a probe assembly into the socket, the measurement function is segmented from the traditional tester system, allowing independent characterization of each segment's loss properties through separate calibration procedures.
Solution Approach 2:
The probe assembly acts as an intermediary device between the tester system and the device under test. It includes measurement probes that directly contact device socket pins and de-embedding fixtures that interface with the loadboard, serving as a mediator that enables direct measurement at the socket pin level while allowing the tester to remain calibrated only to the pogo pins.
2Adaptability or versatility
If external equipment is connected to a single device socket pin at a time using probe assembly, then signal measurement can be performed, but it is not feasible to provide a loopback path for internal testing of devices with multiple antennas
Solution Approach 1:
The probe assembly is designed with multiple probes and a reconfigurable switch matrix that enable multiple functions: direct measurement of individual pins, loopback testing between multiple pins, and characterization of signal paths. This multi-functionality allows the same device to be tested for both external signal reception and internal loopback paths without requiring different equipment.
Solution Approach 2:
The probe assembly incorporates a reconfigurable switch matrix that dynamically routes signals between different pins and measurement paths based on the testing requirements. This dynamic reconfiguration enables loopback testing by electronically switching connections without manual intervention, adapting the measurement topology to match the device under test configuration.
3Measurement precision
If socket sp2 files are used to model signal loss through socket, then an attempt is made to determine signal power, but the model is not correct or accurate enough to determine the precise RF power being delivered to the socket pins
Solution Approach 1:
The invention performs preliminary calibration measurements using de-embedding fixtures before actual device testing. By measuring the insertion loss of the socket and loadboard traces separately using known calibration standards, the system pre-determines accurate loss values that are then applied during device testing, eliminating the need for inaccurate theoretical models.
Solution Approach 2:
The probe assembly performs self-characterization by measuring its own insertion loss and signal path properties through built-in de-embedding fixtures and calibration standards. This self-service approach allows the measurement system to determine its own accurate loss parameters without relying on external model files or theoretical calculations.
Data Source
AI summary
Various embodiments disclosed herein provide a method for calibrating power signals received at one or more device socket pins associated with a plurality of sockets in a multi-site calibration assembly. The method comprises inserting a calibration probe assembly into a test socket, programming a test equipment communicatively coupled to the test socket to control operation of a first switch to selectively couple a first pin of the test socket to a first equipment port of the test equipment, and control operation of a second switch to selectively couple a second pin of the test socket to a second equipment port of the test equipment, electrically stimulating the first pin with an RF signal via the first equipment port, measuring the RF signal propagated from the first pin and received at the second pin via the second equipment port, and determining a power value associated with the RF signal.