Inclined-Plane Microscope Alignment for Higher Light Collection
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Solution Overview
Problem
Inclined plane microscopes face challenges in efficiently collecting scattered and fluorescent light due to the misalignment of the optical axes, leading to reduced light yield and complexity in adjusting optical components, particularly when using cover slips.
Innovation Solution
The alignment unit is tilted relative to the real intermediate image, with a focal plane offset to ensure the image field is within the depth of field region, allowing for improved light collection and flexibility in optical adjustments without modifying components.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If the alignment unit is tilted relative to the real intermediate image, then light collection efficiency is improved, but the optical system becomes more complex
Solution Approach 1:
The alignment unit is tilted by an offset angle relative to the real intermediate image, introducing a dimensional change in the optical path arrangement. This tilting allows the optical axes of the detection assembly and alignment unit to be non-collinear, thereby improving light collection efficiency without requiring a complete redesign of the optical system
2Device complexity
If the depth of field is strongly increased to dispense with inclined arrangement, then system structure is simplified, but correction of artifacts becomes demanding
Solution Approach 1:
Instead of strongly increasing the depth of field which would simplify structure but require demanding artifact correction, the invention changes the parameter of the alignment unit's orientation by tilting it at an offset angle. This parameter change allows the image field to be positioned within the depth of field region while maintaining reasonable correction requirements
3Measurement precision
If the alignment unit is tilted with offset angle, then signal-to-noise ratio is enhanced, but the depth of field region must be precisely controlled
Solution Approach 1:
The alignment unit is pre-configured with a specific tilt offset angle that positions the image field within the depth of field region. This preliminary arrangement ensures optimal signal-to-noise ratio while the depth of field region is designed to accommodate the tilted image field, reducing the precision burden during operation
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration enhances light yield and signal-to-noise ratio, enables easier integration of cover slips, and simplifies optical adjustments, while maintaining image quality and resolution.
Implementation Method 1
detection assembly for collecting scattered light and/or fluorescent light from regions of a sample volume that are illuminated by a light sheet
Implementation Method 2
detection assembly for collecting scattered light and/or fluorescent light from regions of a sample volume that are illuminated by a light sheet
Implementation Method 3
the alignment unit has a depth of field region, wherein a focal plane of the alignment unit is tilted by an offset angle in relation to the real intermediate image, and wherein the predetermined image field of the real intermediate image to be imaged by the alignment unit is located completely within the depth of field region
Data Source
AI summary
An inclined plane microscope includes a detection assembly for collecting scattered light and/or fluorescent light from regions of a sample volume illuminated by a light sheet, wherein the detection assembly, on its side facing away from the sample volume, is configured to image a real intermediate image of the regions of the sample illuminated by the light sheet, and wherein the real intermediate image is tilted in relation to a focal plane of the detection assembly, and an optical alignment unit for imaging a predetermined image field of the real intermediate image onto a detector, wherein the alignment unit has a depth of field region, wherein a focal plane of the alignment unit is tilted in relation to the real intermediate image, and wherein the predetermined image field of the real intermediate image to be imaged by the alignment unit is located completely within the depth of field region.