Inclined Probe Tip for Fine Inspection Point Contact
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Solution Overview
Problem
The scaling-down of circuit boards has made it difficult for conventional probes to accurately contact fine inspection points, as the contact resistance between probes and inspection points affects measurement accuracy, especially in the four-point probe method.
Innovation Solution
A probe with a bar-like shape and a distal end portion inclined relative to its axial center, connected by a flat ribbon-shaped main body, allowing for closer apex positioning and easier contact, along with a chamfered distal end surface to prevent contamination, and a holding member to maintain the probes in an optimal orientation.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If conventional probes are used for inspection, then the probe structure is simple, but the probes cannot accurately contact fine inspection points due to scaling-down of circuit boards
Solution Approach 1:
The probe tip is designed with an asymmetric inclined surface rather than a symmetric cylindrical shape. The inclined surface allows the apex portion to be positioned closer to the inspection point while maintaining structural integrity, enabling accurate contact with fine inspection points without increasing overall probe complexity
Solution Approach 2:
The probe structure transitions from a conventional cylindrical tip to an inclined surface geometry, effectively utilizing the spatial dimension to position the apex closer to the inspection point. This dimensional change enables precise contact without requiring proportionally smaller probe dimensions
2Measurement precision
If two probes are brought into contact with one inspection point, then measurement accuracy is improved by suppressing contact resistance influence, but it becomes difficult to contact fine inspection points
Solution Approach 1:
The inclined surface creates an asymmetric geometry where the apex portion extends closer to the inspection point. This asymmetric design allows two probes to be positioned with their apex portions close together, enabling both probes to contact fine inspection points simultaneously while maintaining the four-point probe measurement method for high accuracy
Solution Approach 2:
The probe is pre-formed with an inclined surface and chamfered edges during manufacturing, so that when two probes are brought together, their apex portions are already positioned optimally close to each other. This preliminary geometric preparation eliminates the need for complex alignment procedures during operation
3Manufacturing precision
If the distal end surface is flat and perpendicular to axial center, then the probe structure is simple, but the apex portions cannot be positioned close enough for fine inspection points
Solution Approach 1:
The distal end surface is designed with an inclined plane rather than a flat perpendicular surface, creating asymmetry that positions the apex closer to the inspection point. This inclined geometry achieves precise apex positioning without requiring complex multi-component structures
Solution Approach 2:
Only the distal end portion of the probe is given the inclined surface geometry, while the rest of the probe maintains a simple cylindrical or conical shape. This localized geometric modification achieves the desired apex positioning precision without complicating the overall probe structure
Data Source
AI summary
A probe is a probe having a substantially bar-like shape and includes a distal end portion with a substantially columnar shape adapted to be in contact with an inspection point provided on a device under test, a base end portion with a substantially columnar shape on an opposite side of the distal end portion, and a main body portion formed in a flat ribbon shape and extended to connect the distal end portion to the base end portion. The distal end portion is provided with a distal end surface inclined relative to and intersecting with an axial center of the probe.