Incremental Criticality and Yield Gradient Computation

The patent segments the circuit into multiple blocks and divides the computation of criticality and yield gradient into incremental updates. Instead of computing metrics for the entire circuit simultaneously, the method processes individual blocks and their interactions separately, allowing parallel computation and reducing overall computational burden while maintaining accuracy.

The patent performs preliminary computation of block-level criticality and yield gradient metrics before assembling the complete circuit analysis. By pre-computing metrics for individual blocks and storing them for later retrieval and combination, the method avoids redundant calculations when analyzing the complete circuit, significantly improving optimization speed.

The patent segments the timing analysis into block-level analyses that can be performed independently and then combined. Each block's timing characteristics are analyzed separately, and the results are aggregated to produce the complete circuit timing analysis, reducing the time required for comprehensive analysis.

The patent implements incremental updates that allow the timing analysis to be continuously refined as circuit modifications are made. Instead of performing complete re-analysis, the method continuously updates only the affected portions of the timing analysis, maintaining accuracy while minimizing computation time throughout the optimization process.