Indexable Test Probe Tip With Adjustable Length

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Solution Overview

Problem

Existing test probes require multiple sets or adjustable tips to accommodate varying lengths, leading to user inconvenience and potential safety issues due to unknown exposed tip lengths not meeting safety standards, necessitating additional measurements.

Innovation Solution

An indexable test probe tip system with a conductive member and insulative member, where a slide member allows for adjustable exposure of the conductive tip, and a locking mechanism to secure the position, along with visual or tactile labels indicating the exposed length to ensure compliance with safety standards.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If multiple sets of test probes with different probe tip lengths are used, then different length requirements are met, but device complexity and user burden increase

Engineering Contradiction:

Improveability to accommodate different probe tip lengthsVSAvoidnumber of probe sets to manage

Core Design Contradiction:

Adaptability or versatilityVSDevice complexity

Solution Approach 1:

The probe tip is designed to be adjustable and reconfigurable, allowing a single probe to perform multiple functions by changing tip lengths. The probe tip can be extended or retracted to provide different effective lengths, eliminating the need for multiple separate probe sets while maintaining adaptability to various measurement requirements

Inventive Principle:

Principle #6Universality (Multi-functionality)

Solution Approach 2:

The probe tip incorporates a dynamic adjustment mechanism that allows the user to change the probe tip length during use. The mechanism enables the probe tip to move between fixed positions, providing different lengths as needed without requiring replacement of the entire probe assembly

Inventive Principle:

Principle #15Dynamics

2Ease of repair

If removable probe tips are used, then probe replacement is simplified, but risk of misplacement and loss increases

Engineering Contradiction:

Improveease of probe tip replacementVSAvoidavailability of correct probe tip

Core Design Contradiction:

Ease of repairVSReliability

Solution Approach 1:

The adjustment mechanism integrates the probe tip securing function into the length adjustment system. The same mechanism that adjusts the probe tip length also locks and secures the probe tip in place, combining multiple functions into a single integrated system that eliminates the need for separate removable tips while ensuring reliable retention

Inventive Principle:

Principle #5Merging (Combining)

3Adaptability or versatility

If slideable probe tips are used, then single probe provides varying lengths, but exposed tip length control and safety compliance become uncertain

Engineering Contradiction:

Improveability to vary probe tip lengthVSAvoidprecision of exposed tip length

Core Design Contradiction:

Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The probe tip adjustment mechanism includes pre-defined fixed positions that are established during manufacturing to ensure precise exposed tip lengths. These predetermined positions are designed to meet safety standards, eliminating the need for user measurement and ensuring compliance without requiring complex user calibration procedures

Inventive Principle:

Principle #10Preliminary action

Solution Approach 2:

The mechanism includes visual indicators or indexing features that provide feedback to the user about the current probe tip length position. This feedback system ensures the user can identify the correct predetermined position, verifying that the exposed tip length meets safety requirements without requiring additional measurement tools or procedures

Inventive Principle:

Principle #23Feedback

4Ease of operation

If longer probe tip exposure is allowed, then ease of insertion into wall sockets improves, but arc flash hazard increases

Engineering Contradiction:

Improveease of probe insertionVSAvoidarc flash hazard

Core Design Contradiction:

Ease of operationVSObject-affected harmful factors

Solution Approach 1:

The probe tip length is adjusted by changing the exposure parameter to predetermined values that balance ease of operation with safety. The mechanism allows the probe tip to be set to specific lengths appropriate for different application categories, ensuring sufficient exposure for wall socket insertion while limiting maximum exposure to prevent arc flash hazards in high-energy environments

Inventive Principle:

Principle #35Parameter changes

Data Source

PatentUS8922231B2Method and apparatus for indexing an adjustable test probe tip

Publication Date: 2014.12.30 FLUKE CORP

AI summary

Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.