Indium-Doped Internal Electrodes for Thin-Dielectric MLCC Reliability
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Solution Overview
Problem
Multilayer ceramic capacitors face reliability issues due to high electrical field strength caused by reduced dielectric layer thickness, which is critical for safety and long-term performance, especially in harsh environments, and there is a demand for smaller size with higher capacitance.
Innovation Solution
A multilayer electronic component design with a specific range of indium (In) content in the surface and central portions of the internal electrode, relative to nickel (Ni) content, and in the dielectric layer, to enhance bonding strength, prevent electron movement, and improve capacitance and reliability, with indium content ranging from 0.46 to 1.08 at% compared to nickel in the surface layer and 0.41 to 0.62 at% in the central portion, and 0.3 to 3.3 at% compared to titanium in the dielectric layer.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the dielectric layer thickness is reduced to achieve smaller size and higher capacitance, then the capacitance and size requirements are met, but the electrical field strength increases causing low reliability
Solution Approach 1:
The patent changes the chemical composition parameters of the internal electrode by controlling indium content ratios (0.46 to 1.08 at% In/(Ni+In) in surface layer, 0.41 to 0.62 at% in central portion) to modify the electrode's physical and chemical properties, enabling it to withstand higher electrical field strengths despite reduced dielectric thickness
Solution Approach 2:
The patent uses composite material composition in the internal electrode by combining nickel and indium in specific ratios, creating a composite structure that provides both electrical conductivity and enhanced resistance to electrical field-induced degradation, thereby improving reliability in thin-dielectric configurations
2Volume of moving object
If the dielectric layer thickness is reduced to achieve smaller size, then the size requirement is met, but the electrical field strength increases causing safety issues
Solution Approach 1:
The patent converts the potentially harmful high electrical field strength into a manageable condition by using indium-containing electrode material that leverages the high field for beneficial electrochemical effects at the electrode-dielectric interface, such as improved bonding and stabilized electrical characteristics, thereby transforming the harmful factor into a beneficial one
Solution Approach 2:
The indium in the internal electrode acts as an intermediary element between the electrode and the dielectric layer, mediating the interaction at the interface to reduce the harmful effects of high electrical field strength through improved interface properties and electron transport characteristics
Data Source
AI summary
A multilayer electronic component includes a body including a dielectric layer and an internal electrode alternately disposed with the dielectric layer interposed therebetween in a first direction; and an external electrode disposed on the body and connected to the internal electrode, wherein 0.46 to 1.08 at % is a range of an indium (In) content compared to nickel (Ni) and indium (In) contents in a surface layer portion of the internal electrode.