Signal Detection Circuit for Inductive Load Using Periodic A/D Conversion
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Solution Overview
Problem
Existing signal detection methods for load driving apparatuses, particularly in vehicles, face challenges with increased circuit size and cost due to the use of CPUs to monitor multiple parameters, leading to potential malfunctions in hot environments and reduced reliability.
Innovation Solution
A signal detecting device that uses a switching element to control current to an inductive load, incorporating an A/D converter circuit that performs conversions during both current supply and non-supply periods, allowing for efficient detection of current and state parameters with reduced circuit scale and increased reliability.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a CPU is used to monitor multiple detection parameters, then the ability to detect abnormalities is improved, but the circuit size increases and cost increases
Solution Approach 1:
The patent segments the monitoring function by separating it from the CPU and implementing it through dedicated detection circuits that generate detection signals directly. This segmentation allows abnormality detection without requiring the CPU to directly monitor all parameters, thereby reducing circuit size while maintaining detection capability.
Solution Approach 2:
The patent introduces detection circuits as intermediary components between the system parameters and the CPU. These intermediary circuits convert physical parameters into detection signals that can be processed with minimal CPU involvement, reducing the overall circuit complexity while preserving abnormality detection functionality.
2Reliability
If a CPU is used to monitor multiple detection parameters, then the ability to detect abnormalities is improved, but the cost increases
Solution Approach 1:
By segmenting the monitoring function into dedicated detection circuits, the patent eliminates the need for expensive high-performance CPUs capable of processing multiple parameters simultaneously. Each detection circuit is designed for a specific parameter, reducing overall system cost while maintaining comprehensive monitoring capability.
Solution Approach 2:
The patent employs simple, low-cost detection circuits instead of expensive CPU-based monitoring systems. These dedicated detection circuits perform their specific function efficiently without requiring the computational power and associated cost of a full CPU implementation.
3Adaptability or versatility
If circuit size increases, then the ability to monitor multiple parameters is improved, but reliability decreases due to increased malfunction risk in hot environments
Solution Approach 1:
The patent segments the monitoring system into multiple simple, dedicated detection circuits rather than one large integrated CPU-based system. This segmentation reduces the complexity of each individual circuit component, making them more reliable in hot environments while collectively providing comprehensive multi-parameter monitoring capability.
4Measurement precision
If A/D conversion is performed continuously for all parameters, then measurement precision is improved, but energy consumption increases and circuit complexity increases
Solution Approach 1:
The patent implements periodic A/D conversion by controlling the A/D converter to operate only during specific time periods when current is supplied to the inductive load. This periodic operation maintains measurement precision for critical parameters while significantly reducing the overall A/D conversion burden and circuit complexity compared to continuous conversion of all parameters.
Data Source
AI summary
A signal detecting device detects, as analog voltage signals, a current flowing through an exciting coil of an electric power generator, a source voltage and a temperature of a regulator that change as a current is fed to the exciting coil by an FET. These analog voltage signals are subjected to A/D conversion by a single A/D converter circuit. The detected current is subjected to A/D conversion in a period during which the FET is ON, while the detected source voltage and the detected temperature are subjected to A/D conversion in a period during which the FET is OFF.