Inductive Overcurrent Detection in Semiconductor Pads
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Solution Overview
Problem
Semiconductor devices are vulnerable to damage from overcurrents caused by events like static electricity or surges, which can flow through pads and potentially harm internal circuits, necessitating effective detection and monitoring mechanisms.
Innovation Solution
A semiconductor device design incorporating a first inductor element connected between pads and the internal circuit, with a second inductor element inductively coupled to generate an induced voltage, and an event detection circuit featuring a monitoring element that senses changes in properties due to the induced voltage, allowing for the detection of overcurrent events.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If an overcurrent protection mechanism is added to detect surges and static electricity, then the reliability of the semiconductor device is improved, but the device complexity increases due to additional inductor elements and event detection circuits
Solution Approach 1:
The protection mechanism is segmented into two independent inductor elements (first and second inductors) where the first inductor is connected to the pad for overcurrent detection and the second inductor is inductively coupled to generate induced voltage for event detection. This segmentation allows each component to have a specialized function, improving reliability while maintaining manageable complexity through modular design
Solution Approach 2:
The second inductor element acts as an intermediary that converts the overcurrent signal from the first inductor into an induced voltage that can be safely processed by the event detection circuit. This intermediary mechanism isolates the detection circuit from direct exposure to harmful overcurrent while still enabling effective event detection
2Measurement precision
If a monitoring element is added to sense induced voltage for event detection, then the measurement precision of overcurrent events is improved, but the device complexity increases due to additional circuit components
Solution Approach 1:
The monitoring element uses electromagnetic induction principles to detect overcurrent events electrically rather than through direct current measurement. The second inductor generates an induced voltage proportional to the overcurrent, which the monitoring element senses through property changes, providing precise event detection while avoiding the complexity of direct high-current measurement circuits
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution enables the semiconductor device to effectively detect and monitor overcurrent events, preventing damage to internal circuits and managing risk factors during production, manufacturing, and transportation by using the induced voltage to write and determine the occurrence and intensity of events.
Implementation Method 1
a second inductor element inductively coupled to the first inductor element, and configured to generate an induced voltage due to an overcurrent flowing in the first inductor element
Implementation Method 2
a monitoring element connected to the second inductor element, the monitoring element is configured to generate an event detection signal by sensing the induced voltage across the second inductor element
Data Source
AI summary
A semiconductor device includes an internal circuit connected to at least one pad. A first inductor element is connected between the at least one pad and the internal circuit, a second inductor element coupled to the first inductor element and generating an induced voltage due to an overcurrent flowing in the first inductor element. An event detection circuit includes a monitoring element connected to the second inductor element. The monitoring element is configured to generate an event detection signal by sensing changes in properties of the monitoring element caused by at least one of the induced voltages generated in the second inductor element and a current flowing in the second inductor element. The internal circuit supplies an operating voltage to the event detection circuit, and determines whether an event causing the overcurrent has occurred by receiving the event detection signal from the event detection circuit.