Inductive Probe Reference Component Interference Correction
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Solution Overview
Problem
Inductive measuring probes experience high inaccuracies in the micrometer and nanometer range due to interference effects from the sensor, control device, and processing device, leading to inaccurate measurement results.
Innovation Solution
An inductive probe equipped with an electrical reference component that converts an analog input voltage into an analog output voltage, with a processing device combining the measurement signal from the sensor and the reference component to produce a low-noise and precise measurement result by correcting for interference effects using a reference value or function formed from the output voltage of the reference component.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional inductive measuring probes are used for micrometer and nanometer range measurements, then the measurement capability is provided, but high inaccuracies occur due to interference effects from the sensor, control device, and processing device
Solution Approach 1:
The patent introduces a reference component that is an electrical copy or model of the sensor, sharing identical electrical properties and interference characteristics. This reference component generates a reference signal that mirrors the interference effects, allowing these effects to be identified and removed from the actual measurement signal through signal processing, thereby eliminating the harmful interference effects that degrade measurement accuracy
Solution Approach 2:
The patent implements a feedback mechanism where the reference signal from the reference component is fed into the evaluation device. The evaluation device compares the actual measurement signal with the reference signal and uses the reference information to correct and compensate for interference effects in real-time, improving measurement precision by continuously adjusting for harmful interference
2Measurement precision
If a reference component is added to the inductive measuring probe to correct interference effects, then measurement precision is improved, but device complexity increases
Solution Approach 1:
Instead of adding complex interference cancellation hardware, the patent uses a simplified reference component that replicates only the essential electrical characteristics and interference behavior of the sensor. This electrical copy approach achieves interference correction without requiring complex additional hardware systems
Solution Approach 2:
The patent integrates the reference component and evaluation functions into the existing sensor system architecture. The reference component is electrically connected to the same excitation source and processing circuitry as the sensor, merging multiple functions into a unified system that reduces overall complexity compared to separate interference correction systems
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach minimizes or eliminates interference effects, resulting in highly accurate and precise measurement results, especially in the micrometer and nanometer range, by simulating the sensor's electrical properties and processing the signals synchronously to account for identical interference influences.
Implementation Method 1
A displacement of the core relative to the coil arrangement causes a change in the inductance of the coil arrangement
Implementation Method 2
The primary coil, the secondary coils and the magnetically effective core are integrated into the probe. If the core connected to the probe element changes its position during the length measurement, this affects the magnetic coupling between the primary coil and the secondary coil
Data Source
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AI summary
The invention proposes an inductive measuring probe and a method for operating the measuring probe. The measuring probe is equipped with a movably arranged probe element, with a sensor (1) having a coil arrangement (14) and a core (15) which is arranged such that it can be displaced in relation to the coil arrangement (14) and which is connected to the probe element, wherein the sensor (1) converts a deflection of the probe element into an analog measurement signal, with an electrical reference component (2) which converts an analog input voltage into an analog output voltage, with a drive device which generates an identical analog input voltage for the sensor (1) and the reference component (2), with a processing device which determines the influence of disturbing effects from the analog output voltage of the reference component (2), and which determines a measurement result from the measurement signal and the influence of disturbing effects.