Inductor Shielding Structure With High-k Liner for Higher Q Factor

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Inductors in semiconductor devices experience reduced Q factor due to eddy currents generated by the magnetic field, affecting their performance.

Innovation Solution

A semiconductor device with a shielding structure composed of conductive filling layers and high-k dielectric liner layers disposed under the inductor, which cuts off or reduces eddy currents, thereby increasing the Q factor.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If an inductor is operated, then the magnetic field is generated, but eddy current is generated which reduces the Q factor

Engineering Contradiction:
Improveinductor operationVSAvoideddy current loss
Core Design Contradiction:
PowerVSLoss of energy

Solution Approach 1:

The patent converts the harmful eddy current effect into a beneficial shielding effect by placing conductive filling layers in recesses beneath the inductor. These conductive layers, when exposed to the inductor's magnetic field, generate eddy currents that create an opposing magnetic field, effectively shielding the underlying substrate and reducing energy loss.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Solution Approach 2:

The patent introduces high-k dielectric liner layers as intermediary materials between the conductive filling layers and the substrate. These dielectric layers with high permittivity values (greater than 3.9) act as mediators that enhance the shielding effect while electrically isolating the conductive layers from direct contact with the substrate, thereby reducing eddy current losses.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Reliability

If a shielding structure is added to reduce eddy current, then the Q factor is improved, but the device complexity increases

Engineering Contradiction:
ImproveQ factorVSAvoidshielding structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The shielding structure is segmented into multiple discrete components: conductive filling layers placed in recesses, high-k dielectric liner layers, and dielectric layers. This segmentation allows each component to perform its specific function while simplifying the overall manufacturing process and reducing structural complexity compared to a monolithic shielding design.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The shielding structure utilizes recesses (void spaces) in the substrate that are partially filled with conductive materials and dielectric materials. This porous or partially-filled approach reduces the amount of material required compared to completely filled structures, thereby reducing device complexity while maintaining shielding effectiveness.

Inventive Principle:
Principle #31Porous materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The implementation of the shielding structure enhances the Q factor of the inductor, improving its performance by reducing eddy current losses.

Implementation Method 1

The plurality of high-k dielectric liner layers are between the plurality of conductive filling layers and the substrate

Methodology Applied
Scientific EffectHigh-k dielectric effect: Dielectric Permittivity

Implementation Method 2

When the inductor is in operation, the magnetic field in the inductor region readily generates eddy current

Methodology Applied
Scientific EffectEddy current: Eddy Currents

Data Source

PatentUS20250293183A1Semiconductor device
Publication Date: 2025.09.18 UNITED MICROELECTRONICS CORP
  • US20250293183A1 patent drawing
  • US20250293183A1 patent drawing
  • US20250293183A1 patent drawing

AI summary

A semiconductor device includes a substrate, a shielding structure, and an inductor. The shielding structure is disposed in the substrate and includes a plurality of conductive filling layers and a plurality of high-k dielectric liner layers. The plurality of conductive filling layers are in a plurality of recesses of the substrate. The plurality of high-k dielectric liner layers are between the plurality of conductive filling layers and the substrate. The plurality of conductive filling layers are electrically connected to each other and grounded. The inductor is located above the shielding structure.