Infrared Detection Device Using Thermal Hotspots for Super-Resolution
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Solution Overview
Problem
Conventional infrared detection methods face limitations due to the diffraction limit, requiring expensive and contact-based techniques like SNOM and IR-AFM, which are difficult to implement and limited to surface investigations, and ATR methods are restricted by the refractive index of the cell used.
Innovation Solution
A device and method utilizing a light source emitting a shorter wavelength beam to create localized hotspots on a sample, allowing for the measurement of infrared thermal radiation with a processing module synchronized to capture signals within a time window that limits the hotspot size to be smaller than the infrared wavelength, enabling super-resolution imaging without contact and external sources.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional infrared microscopy or spectrometry is used, then the measurement can be performed, but the spatial resolution is limited to about 10 microns due to the diffraction limit
Solution Approach 1:
The patent applies preliminary action by pre-heating the sample at specific locations before measurement. The sample is heated in advance at the positions to be measured, creating thermal hotspots that will be detected during the infrared measurement process. This allows the spatial resolution to be determined by the heating spot size rather than the detection aperture size, overcoming the diffraction limit.
Solution Approach 2:
The patent replaces the conventional optical mechanical system with a thermal field-based system. Instead of using optical lenses and detectors to achieve high resolution, the invention uses thermal heating to create localized hotspots and detects their thermal radiation. This substitution of the physical field (optical to thermal) enables super-resolution without requiring complex optical systems.
2Measurement precision
If SNOM with AFM tip is used to achieve super-resolution, then the diffraction limit is circumvented, but the device becomes expensive and requires contact with the sample surface
Solution Approach 1:
The patent replaces the mechanical AFM tip system with a non-contact thermal heating system. Instead of using a physical probe that must touch the sample surface, the invention uses optical or electrical heating methods to create thermal hotspots anywhere on the sample surface without mechanical contact. This eliminates the complexity and cost of AFM while maintaining super-resolution capability.
Solution Approach 2:
The patent introduces thermal radiation as an intermediary between the heating source and the detection system. The thermal hotspots act as intermediaries that convert the input energy (light or electricity) into thermal energy, which is then detected in the infrared range. This intermediary approach allows non-contact measurement while achieving high spatial resolution.
3Measurement precision
If IR-AFM with modulated infrared source is used, then thermal expansion can be measured, but the technique requires contact with the sample and modulated infrared source, making it expensive and difficult to implement
Solution Approach 1:
The patent applies preliminary heating action before measurement. The sample is heated in advance at the positions to be measured, creating thermal hotspots that will be detected during the infrared measurement process. This eliminates the need for continuous modulated infrared heating during measurement, simplifying the device requirements.
Solution Approach 2:
The patent replaces the complex IR-AFM system with a simpler thermal radiation detection system. Instead of measuring thermal expansion through mechanical cantilever deflection, the invention directly detects the thermal radiation emitted by heated spots using infrared detectors. This substitution eliminates the need for mechanical components and modulated infrared sources.
4Measurement precision
If ATR method is used to increase resolution, then the resolution improves, but it is restricted by the refractive index of the ATR cell material
Solution Approach 1:
The patent changes the fundamental parameter from optical refraction to thermal conduction and radiation. Instead of relying on the refractive index of ATR cell materials to achieve resolution, the invention uses thermal heating and thermal radiation detection. This parameter change allows the method to work with any material that can be heated and emits thermal radiation, eliminating the refractive index limitation and expanding wavelength range to include mid-infrared and terahertz frequencies.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach achieves super-resolution imaging and spectroscopy with improved spatial resolution, allowing for non-contact probing of both surface and subsurface infrared properties, reducing costs, and expanding applicability to longer wavelengths, including mid-infrared and terahertz frequencies.
Implementation Method 1
A device and method utilizing a light source emitting a shorter wavelength beam to create localized hotspots on a sample
Implementation Method 2
allowing for the measurement of infrared thermal radiation with a processing module synchronized to capture signals
Implementation Method 3
an infrared detector (50) configured to emit a signal (S1) representative of the thermal radiation of wavelength (L_F2) emitted by a set of at least one hotspot (21)
Data Source
AI summary
An infrared-detecting device, includes an infrared detector configured to emit a signal representative of the thermal radiation of a hotspot, and a light source configured to emit an incident beam, preferably in a window of UV or visible wavelength. The infrared-detecting device furthermore comprises a synchronizing device connected to the light source and to the infrared detector or to the processing module, and configured to emit a synchronization signal, the infrared detector being configured to be activated in a preset time window depending on said synchronization signal.