Infrared Focal Plane Array Bad Pixel Detection

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Solution Overview

Problem

Current methods for measuring performance parameters and detecting bad pixels in infrared focal plane array modules are inaccurate, especially when dealing with modules having two or more response areas, leading to errors in imaging quality and assessment.

Innovation Solution

A method involving an infrared imaging camera and computer system that captures continuous digital images, performs image division, and uses responsivity functions to measure performance parameters like signal transmission, temporal noise, spatial noise, and non-uniformity, while defining bad pixels based on gain and offset tables after two-point correction, and identifying pixels with abnormal noise values.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of operation

If the offset value method is used to detect bad pixels, then the detection process is simple, but it is not appropriate for infrared focal plane arrays with two or more response areas, leading to inaccurate detection

Engineering Contradiction:
Improvedetection process simplicityVSAvoidbad pixel detection accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent divides the infrared focal plane array into multiple response areas based on actual responsivity characteristics. Each response area is then processed independently with its own statistical parameters (mean and standard deviation), allowing accurate bad pixel detection in each region without being affected by other regions with different characteristics.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The detection process is segmented into multiple steps: first dividing the array into response areas, then calculating statistical parameters for each area separately, and finally detecting bad pixels within each area using area-specific thresholds. This segmentation resolves the contradiction by making the simple statistical method applicable to multi-response-area arrays.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If the extreme value method or gain value method is used, then the detection covers the full range of pixel values, but pixels in different response areas cannot be properly distinguished, causing image distortion

Engineering Contradiction:
Improvedetection coverage rangeVSAvoidimage quality uniformity
Core Design Contradiction:
Measurement precisionVSStability of the object's composition

Solution Approach 1:

The patent applies local quality by calculating statistical parameters (mean and standard deviation) separately for each response area. This allows the detection threshold to adapt to the local characteristics of each area, ensuring that pixels are evaluated relative to their own response area rather than being compared across areas with different gain and offset values, thus preventing image distortion.

Inventive Principle:
Principle #3Local quality

3Manufacturing precision

If two-point correction is applied to correct gain and offset values, then the responsivity values of pixels can be corrected, but the different response areas still increase spatial and temporal noise

Engineering Contradiction:
Improvepixel responsivity correctionVSAvoidspatial and temporal noise
Core Design Contradiction:
Manufacturing precisionVSObject-generated harmful factors

Solution Approach 1:

The patent addresses the noise issue by treating each response area independently. After two-point correction, each response area undergoes separate statistical analysis to determine its mean and standard deviation. Bad pixels are then detected using area-specific thresholds, which prevents noise from one response area from being misinterpreted as bad pixels in another response area, thereby reducing false detections.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the accuracy of measuring performance parameters and reduces errors in detecting bad pixels, even in modules with multiple response areas, by correctly identifying pixel locations and numbers, thereby improving imaging quality.

Implementation Method 1

the energy of infrared light radiated from an object can be measured by an infrared detector

Methodology Applied
Scientific EffectInfrared radiation detection: Infrared Radiation

Implementation Method 2

The voltage values and current values obtained from the measurement of the infrared detector

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Data Source

PatentUS9883178B2Method for measuring performance parameters and detecting bad pixels of an infrared focal plane array module
Publication Date: 2018.01.30 CUNLTD OPTICS CORP
  • US9883178B2 patent drawing
  • US9883178B2 patent drawing
  • US9883178B2 patent drawing

AI summary

A method for measuring performance parameters of an infrared focal plane array (IRFPA) module has steps of capturing continuous digital images from the IRFPA module, performing image division on each of the continuous digital images, and measuring multiple performance parameters of each divided digital image, including signal transmission function, a temporal noise equivalent temperature difference, a spatial noise equivalent temperature difference, non-uniformity and operability, thereby increasing accuracy in measuring the performance parameters of the IRFPA module. Also, a method for detecting bad pixels of an IRFPA module includes a gain value method, an offset value method, a temporal noise method and a spatial noise method, is applicable to the IRFPA module with more than two response areas, and avoids incorrect detection to treat pixels in different response areas as bad pixels.