Infrared Imager Run-Time Calibration for Fixed Pattern Noise
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Solution Overview
Problem
Infrared imaging systems face instability and fixed pattern noise due to non-uniformity issues, particularly in detectors operating at higher temperatures, which traditional factory calibrations fail to address effectively.
Innovation Solution
A method involving factory calibration using two temperature sources to establish initial non-uniformity correction terms, followed by run-time calibration with a single reference object to update gain and offset corrections, mitigating instability and residual fixed pattern noise.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional factory calibration is used, then initial non-uniformity correction is established, but instability and residual fixed pattern noise persist at higher operating temperatures
Solution Approach 1:
The patent implements dynamic run-time calibration that updates gain and offset maps during operation based on current temperature conditions. This transforms the static factory calibration into a dynamic process that adapts to changing operating temperatures, resolving the contradiction between initial correction accuracy and ongoing stability at elevated temperatures.
Solution Approach 2:
The system changes calibration parameters (gain and offset maps) based on operating temperature conditions. By monitoring temperature and updating correction parameters accordingly, the system maintains measurement precision across varying thermal environments, addressing the limitation of fixed factory calibration at higher temperatures.
2Reliability
If run-time calibration with single reference object is performed, then gain and offset maps are updated dynamically, but calibration time and processing overhead increase
Solution Approach 1:
The patent performs partial calibration by updating only gain and offset maps using a single reference object at run-time, rather than complete recalibration. This partial action approach maintains correction effectiveness while reducing the time and processing overhead associated with full calibration procedures.
Solution Approach 2:
Factory calibration performs preliminary comprehensive calibration to establish initial gain and offset maps. This preliminary action provides a foundation that reduces the complexity and time required for subsequent run-time calibrations, balancing thoroughness with efficiency.
3Speed
If detectors operate at higher temperatures, then operational flexibility and speed improve, but non-uniformity issues and fixed pattern noise worsen
Solution Approach 1:
The system implements feedback through continuous monitoring of detector temperature and performance characteristics. This feedback enables dynamic adjustment of gain and offset maps to compensate for temperature-induced non-uniformity, allowing high-temperature operation while maintaining image uniformity and measurement precision.
Data Source
AI summary
Techniques for facilitating non-uniformity correction calibrations are provided. In one example, an infrared imaging system includes an infrared imager and a logic device. The infrared imager is configured to capture a set of infrared images of a reference object. The reference object is substantially at a single temperature. The logic device is configured to initiate a run-time calibration of the infrared imager and generate a gain map based on the set of infrared images and an offset map associated with the infrared imager. Related devices and methods are also provided.