Infrared Imaging via Guided Ultrasonic Wave Time-of-Flight
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Solution Overview
Problem
Traditional infrared imaging methods, such as bolometers, suffer from low sensitivity and slow imaging frame rates, limiting their effectiveness in detecting infrared energy.
Innovation Solution
The use of a guided ultrasonic wave structure to measure the Time-of-Flight (ToF) of ultrasonic waves traveling in metal structures, which changes with temperature due to incident infrared energy, allowing for higher sensitivity and faster frame rates through digital signal processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional bolometer methods are used to measure infrared energy, then the imaging system can detect infrared radiation, but the sensitivity is low and the imaging frame rate is slow
Solution Approach 1:
The patent replaces the traditional mechanical/thermal measurement system (bolometer measuring resistive change) with an acoustic wave-based measurement system. Ultrasonic waves are generated in a waveguide, and their time-of-flight is measured to detect temperature changes caused by infrared absorption. This substitution enables both high sensitivity (30x better than bolometers) and high frame rates (at least 4x faster) by using acoustic wave propagation characteristics rather than thermal conduction and resistance changes.
Solution Approach 2:
The patent changes the measurement parameter from electrical resistance (in bolometers) to acoustic wave time-of-flight. By measuring how the speed of sound in the waveguide material changes with temperature, the system achieves superior sensitivity and speed. The time-of-flight parameter provides a more responsive and precise indicator of temperature change compared to resistive measurements in traditional bolometers.
2Measurement precision
If traditional bolometer techniques are employed, then infrared energy can be detected through resistive change measurement, but the detection sensitivity remains low
Solution Approach 1:
The patent replaces the slow thermal-conduction-based resistive measurement system with a fast acoustic wave propagation system. The ultrasonic wave time-of-flight measurement responds almost instantaneously to temperature changes, eliminating the thermal inertia inherent in bolometer designs. This results in both higher detection sensitivity and faster imaging response time.
Solution Approach 2:
The patent employs periodic ultrasonic wave generation and measurement cycles to continuously monitor temperature changes with high temporal resolution. By using pulsed ultrasonic waves and measuring their time-of-flight in repeated cycles, the system achieves rapid sequential measurements that improve both sensitivity and response time compared to continuous slow thermal measurements.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach results in infrared imaging systems with significantly improved sensitivity (up to 30x better) and frame rate (at least 4x faster) compared to state-of-the-art uncooled detectors, enabling novel applications in security, medical imaging, and other fields.
Implementation Method 1
a first structure comprising piezoelectric material
Implementation Method 2
measuring a Time-of-Flight (ToF) of the one or more ultrasonic waves in the waveguide, wherein the ToF is a function of an incident infrared light energy on the waveguide
Implementation Method 3
incident infrared light energy on the waveguide
Implementation Method 4
a third structure comprising a thermal isolation material, wherein the third structure is adjacent to the second structure
Data Source
AI summary
A method of imaging infrared light is provided which comprises: exciting ultrasonic waves in a metal pillar (e.g., Cu pillar); measuring the Time-of-Flight (ToF) of the ultrasonic wave in the waveguide; whereas the ToF is a function of incident Infrared light energy on the waveguide, and reporting the infrared light energy to capture an image. An apparatus of imaging infrared light is provided which comprises: a transducer; a waveguide coupled with the transducer; and a pixel electronic circuit coupled to the transducer, wherein the transducer includes one or more of: PZT, LiNb, AlN, or GaN.