Infrared Pattern Irradiation Timing for Depth Accuracy
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Solution Overview
Problem
Existing image processing systems using infrared patterns for generating three-dimensional images face issues such as loss of object features, increased system cost, and complexity due to the need for multiple cameras, and inaccuracies when visible light images overlap with the object.
Innovation Solution
An image processing device and method that control the timing of infrared pattern irradiation to capture both pattern-irradiated and pattern-free infrared images, allowing for more accurate depth information acquisition without requiring additional cameras or complex signal processing.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If infrared pattern is irradiated onto the object to obtain depth information, then depth measurement capability is improved, but object features (contour and surface pattern) are lost
Solution Approach 1:
The infrared pattern irradiation is performed periodically at predetermined timings that correspond to the image capturing timing. The pattern irradiation unit alternates between irradiating the infrared pattern and not irradiating it, allowing the infrared image capturing unit to obtain both pattern-projected images (for depth information) and pattern-free images (for object features) in a time-multiplexed manner.
2Loss of information
If visible light camera is added to capture texture, then texture information is improved, but system cost increases
Solution Approach 1:
The infrared image capturing unit is designed to perform multiple functions: it captures both depth information (when infrared pattern is projected) and texture/object feature information (when no pattern is projected). By time-multiplexing these two functions on a single device, the system eliminates the need for separate visible light cameras while maintaining the capability to obtain both depth and texture information.
3Loss of information
If multiple types of cameras are used for depth and texture, then information completeness is improved, but signal processing complexity increases
Solution Approach 1:
The patent merges the depth capture function and the texture capture function into a single infrared image capturing unit by time-multiplexing. Since both functions are performed by the same camera using the same imaging sensor, the captured images are naturally in the same coordinate system and require no complex alignment or registration processing, thereby eliminating the signal processing complexity associated with multi-camera systems.
4Illumination intensity
If visible light image is projected onto the object, then visibility is improved, but accurate object shape measurement is degraded
Solution Approach 1:
The patent extracts and separates the visibility function from the measurement function. The infrared pattern irradiation is selectively activated only when depth measurement is required, and deactivated when object features need to be captured. This temporal separation ensures that the infrared pattern never interferes with the object shape measurement, while still providing enhanced visibility when needed for depth capture.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables accurate depth information capture with reduced system complexity and cost, while avoiding inaccuracies caused by visible light overlap, by alternately controlling the infrared pattern irradiation with image capturing, thus improving the precision of object shape recognition.
Implementation Method 1
a pattern irradiation unit that irradiates an infrared pattern onto a surface of a target object
Implementation Method 2
an infrared image capturing unit that captures an infrared image
Data Source
AI summary
There is an image processing device to obtain more accurate depth information, based on a pattern-irradiated infrared image and a pattern-irradiation-free infrared image. The image processing device includes a pattern irradiation unit that irradiates an infrared pattern onto a surface of a target object; and an infrared image capturing unit that captures an infrared image. The pattern irradiation unit performs irradiation at a predetermined timing corresponding to an infrared image capturing unit's image capturing timing. The infrared image capturing unit obtains a pattern-projected infrared image in which the pattern irradiated by the pattern irradiation unit is projected on the target object, and a pattern-free infrared image in which the pattern is not projected on the target object.


