Infrared Surface Property Detection for In-Line Component Quality

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Solution Overview

Problem

Current non-destructive surface analysis methods, such as X-ray fluorescence and X-ray photoelectron spectroscopy, are not suitable for monitoring surface properties during industrial manufacturing processes due to their vacuum requirements, and there is a need for a method to assess metal surface properties quickly, non-destructively, and without contact, especially to adapt manufacturing processes and ensure proper adhesion and sealing.

Innovation Solution

A method utilizing infrared radiation emitted by components to detect differences in surface properties by maintaining a consistent solid angle and distance from the component surface, using a pyroelectric sensor to convert irradiance into a physical signal, allowing for rapid, non-contact, and non-destructive assessment of surface properties.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If established non-destructive surface analysis methods such as X-ray fluorescence or X-ray photoelectron spectroscopy are used, then measurement precision is improved, but the method requires vacuum technology and cannot be used during industrial manufacturing processes

Engineering Contradiction:
Improvesurface property detection accuracyVSAvoidapplicability during manufacturing process
Core Design Contradiction:
Measurement precisionVSAdaptability or versatility

Solution Approach 1:

The patent replaces vacuum-based X-ray analysis methods with infrared radiation detection that operates in atmospheric conditions. The measuring device detects infrared radiation emitted by the component surface without requiring vacuum technology, enabling in-line monitoring during manufacturing processes while maintaining surface property detection capability

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent changes the detection parameter from X-ray interaction to infrared radiation emission in the thermal infrared range (3-14 μm). By detecting irradiance at specific wavelengths where metal oxides have characteristic absorption bands, the method enables surface composition analysis under industrial manufacturing conditions without vacuum requirements

Inventive Principle:
Principle #35Parameter changes

2Measurement precision

If conventional surface analysis methods are used, then surface properties can be determined, but the process requires material removal or process interruption

Engineering Contradiction:
Improvesurface quality assessmentVSAvoidmanufacturing process continuity
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The patent replaces contact-based or process-interrupting analysis methods with non-contact infrared radiation detection. The measuring device can monitor surface properties through the manufacturing process without touching the component or stopping production, maintaining both measurement accuracy and manufacturing continuity

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The patent enables continuous surface property monitoring during the manufacturing process. The infrared detection system operates in real-time without interrupting material flow or production steps, allowing continuous quality assurance while maintaining manufacturing productivity

Inventive Principle:
Principle #20Continuity of useful action

3Productivity

If rapid surface property detection is implemented, then productivity is improved, but measurement precision may be compromised

Engineering Contradiction:
Improvedetection speedVSAvoidsurface property differentiation
Core Design Contradiction:
ProductivityVSMeasurement precision

Solution Approach 1:

The patent uses periodic modulation of the infrared detection system to capture surface property information rapidly. By measuring irradiance at specific wavelengths where metal oxides have characteristic absorption bands and using time-resolved detection, the system achieves both high detection speed and precise surface property differentiation

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The patent enhances detection precision by analyzing spectral parameters in the thermal infrared range. By detecting irradiance at specific wavelengths (3-14 μm) where different metal oxides have distinct absorption characteristics, the method enables rapid differentiation of surface compositions with high precision through spectral analysis

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables the quick and accurate determination of surface properties, facilitating real-time adaptation of manufacturing processes to ensure optimal surface quality for bonding and sealing, without the need for costly chemical analysis or process interruptions.

Implementation Method 1

using a pyroelectric sensor to convert irradiance into a physical signal

Methodology Applied
Scientific EffectPyroelectric effect: Pyroelectric Effect

Implementation Method 2

the infrared radiation emitted by the component at a certain temperature of the component

Methodology Applied
Scientific EffectThermal radiation: Thermal Radiation

Data Source

PatentUS11846501B2Method for detecting the surface properties of components, use of the method for monitoring the surface quality of components and device for adjusting the surface properties of components
Publication Date: 2023.12.19 HENKEL KGAA

AI summary

A method for detecting differences in surface properties of one or more components is provided wherein the infrared radiation emitted by the component at a specific temperature of the component is detected as irradiance on a selected receiver surface relative to the component. When detecting at different positions or on a plurality of components, the solid angle covered by the receiver surface and the distance from the component surface is almost unchanged and differences in the detected irradiance can then be equated with differences in the surface properties of the components. The invention further relates to use of such methods for monitoring and optionally adjusting the surface quality of a component, as well as to a device for adjusting the surface properties in the series production of components.