Infrastructure Defect Detection with Priority-Based Region Display
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Solution Overview
Problem
Existing methods for detecting developing defects in infrastructure structures from multiple images captured at different times often result in a large number of regions being calculated, making it difficult for operators to identify and prioritize critical defects during inspection.
Innovation Solution
An information processing apparatus that extracts defect data from multiple images, calculates priority levels based on differences between the data, and displays regions of developing defects according to these levels to facilitate focused inspection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a large number of regions including developing defects are calculated from compositing multiple high-resolution images, then the detection completeness of defects is improved, but the operator may overlook critical defects due to information overload
Solution Approach 1:
The patent changes the parameter of defect presentation by introducing priority levels (first, second, third priority) based on development degree. This transforms the raw defect data into prioritized information, allowing operators to focus on critical defects first while maintaining complete defect detection capability.
Solution Approach 2:
The patent segments the large set of detected defects into priority groups (first priority, second priority, third priority) based on development degree. This segmentation divides the overwhelming information into manageable segments, with first priority defects requiring immediate attention and lower priority defects can be addressed subsequently.
2Reliability
If all detected developing defects are displayed to the operator, then no defect is missed, but the operator cannot efficiently identify critical defects among numerous regions
Solution Approach 1:
The system performs preliminary sorting and prioritization of defects before presentation to the operator. By pre-calculating priority levels based on development degree and automatically organizing defects into priority groups, the system prepares the information in advance, eliminating the need for operators to manually evaluate each defect's urgency during inspection.
Solution Approach 2:
The patent introduces a priority level parameter that transforms defect data from a flat list into a hierarchical structure. This parameter change enables the system to reliably present all defects while simultaneously highlighting critical ones, achieving both complete detection and efficient identification without increasing inspection time.
3Productivity
If priority levels are calculated and regions are specified based on development degree, then critical defects are prioritized for inspection, but additional processing steps are required
Solution Approach 1:
The system performs self-service by automatically calculating priority levels and specifying regions of interest without requiring manual intervention. The defect detection apparatus autonomously evaluates development degree, assigns priority levels, and generates the prioritized defect list, eliminating the need for additional manual processing steps while improving inspection productivity.
Data Source
AI summary
An information processing apparatus obtains pieces of defect data respectively extracted from a plurality of images captured at different times and detects developing defects on the basis of differences between the pieces of defect data extracted from the images captured at the different times. The information processing apparatus further calculates priority levels of the defects on the basis of the differences between the pieces of defect data, specifies regions that cover the developing defects, and displays the specified regions in accordance with the priority levels.