Inject Insert Segmentation for Epitaxial Gas Uniformity

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Solution Overview

Problem

Conventional semiconductor processing chambers experience non-uniform gas distribution due to 'crosstalk' between multiple flow zones, leading to degraded uniformity of epitaxially-grown films, especially when increasing process gas flow rates to enhance throughput.

Innovation Solution

An inject insert with a monolithic body and multiple zones of inject ports and inlets, allowing for greater flow control, is designed to connect with a gas delivering device, creating distinct zones for finer tuning of gas flow parameters, including varying widths and configurations of inject inlets to optimize gas distribution.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If multiple flow zones feed into a single gas inlet channel to increase throughput, then gas flow rate increases, but crosstalk between zones causes unpredictable tuning results and non-uniform gas distribution

Engineering Contradiction:
Improvegas flow rateVSAvoidgas distribution uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

The gas inlet system is segmented into multiple independent inlet ports, each serving a specific flow zone. This segmentation prevents crosstalk between zones by providing separate access paths for each zone's process gas, allowing independent tuning of gas flow rates and compositions without interference from adjacent zones.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Each flow zone is equipped with customized inlet ports and flow control mechanisms tailored to its specific requirements. The system allows different gas types, flow rates, and compositions to be supplied to different zones independently, enabling precise local optimization of deposition conditions across the substrate surface.

Inventive Principle:
Principle #3Local quality

2Manufacturing precision

If continuous rotation is employed to minimize flow zone non-uniformity, then gas distribution uniformity improves, but rotation alone is insufficient when higher uniformity requirements are needed

Engineering Contradiction:
Improvefilm uniformityVSAvoidrotation mechanism
Core Design Contradiction:
Manufacturing precisionVSDevice complexity

Solution Approach 1:

The chamber is divided into multiple flow zones with independently controllable inlet ports, allowing precise control of gas distribution without relying solely on substrate rotation. This segmentation enables static achievement of uniformity that complements or reduces the need for high-speed rotation.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system provides dynamic control capabilities through independently adjustable inlet ports and flow control mechanisms for each zone, allowing real-time optimization of gas distribution patterns to match substrate positions and process requirements, enhancing uniformity beyond what fixed rotation can achieve.

Inventive Principle:
Principle #15Dynamics

3Productivity

If process gas flow rate is increased to enhance throughput, then productivity improves, but non-uniformity issues are amplified

Engineering Contradiction:
ImprovethroughputVSAvoiddeposition uniformity
Core Design Contradiction:
ProductivityVSManufacturing precision

Solution Approach 1:

Multiple independent inlet ports allow each flow zone to operate at optimized flow rates simultaneously. High total throughput is achieved by summing contributions from all zones, while each zone maintains its own uniformity through independent control, preventing the amplification of non-uniformity that occurs in single-channel systems.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system enables independent adjustment of gas flow rates, compositions, and pressures for each flow zone. This parameter control allows optimization of deposition uniformity in each zone while maintaining high overall throughput, and provides tuning capability to compensate for variations in substrate positioning or chamber conditions.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10760161B2Inject insert for EPI chamber
Publication Date: 2020.09.01 APPLIED MATERIALS INC
  • US10760161B2 patent drawing
  • US10760161B2 patent drawing
  • US10760161B2 patent drawing

AI summary

Embodiments of the present invention provide a liner assembly including an inject insert. The inject insert enables tenability of flow parameters, such as velocity, density, direction and spatial location, across a substrate being processed. The processing gas across the substrate being processed may be specially tailored for individual processes with a liner assembly according to embodiment of the present invention.