Inkjet Head Alignment Inspection Using Multi-Direction Test Patterns

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Solution Overview

Problem

Current droplet application methods using inkjet systems have low reliability in inspecting substrate deviation and nozzle alignment due to the use of linear test patterns, which limits accurate alignment verification.

Innovation Solution

A droplet application device and method that utilize a test pattern with multiple print direction information patterns printed in both forward and reverse directions, allowing a vision inspection unit to calculate deviations in both substrate and inkjet head alignments by comparing dot patterns with reference lines, enhancing the reliability of alignment checks.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If linear test patterns are used for inspection, then the inspection process is simple, but the reliability of substrate deviation and nozzle alignment inspection is very low

Engineering Contradiction:
Improvealignment inspection reliabilityVSAvoidtest pattern complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent transitions from linear one-dimensional test patterns to two-dimensional grid patterns with multiple print direction information. The grid pattern includes first print direction information extending in the substrate transfer direction and second print direction information extending in the ink pack assembly transfer direction, enabling alignment inspection in multiple dimensions simultaneously.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The test pattern is segmented into multiple distinct components: first print direction information patterns, second print direction information patterns, and reference line patterns. Each segment serves a specific inspection function, allowing independent analysis of substrate alignment and nozzle alignment without interference.

Inventive Principle:
Principle #1Segmentation

2Measurement precision

If test patterns are printed only in one direction, then the printing process is efficient, but alignment verification is limited to one direction

Engineering Contradiction:
Improvealignment verification accuracyVSAvoidprinting efficiency
Core Design Contradiction:
Measurement precisionVSProductivity

Solution Approach 1:

The test pattern design enables multi-functional inspection within a single printing operation. The grid pattern simultaneously provides reference lines for substrate alignment verification and print direction information for nozzle alignment verification in both substrate transfer direction and ink pack assembly transfer direction, eliminating the need for separate single-direction printing steps.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20240239121A1Droplet application device and droplet application method
Publication Date: 2024.07.18 SYSTEM ENGINEERING MEGA SOLUTION CO LTD
  • US20240239121A1 patent drawing
  • US20240239121A1 patent drawing
  • US20240239121A1 patent drawing

AI summary

Provided are a droplet application device and a droplet application method, which check printing states for at least two directions when printing a test pattern on a substrate to check deviation of the substrate and a nozzle alignment state of an inkjet head for at least two directions. The droplet application device includes: an inkjet system including an ink pack assembly which includes a plurality of inkjet heads and discharges ink from each of the inkjet heads onto a substrate to print a test pattern, a pack transfer part which transfers the ink pack assembly, and a substrate transfer part which transfers the substrate; and a vision inspection unit for determining an alignment state of the inkjet heads by inspecting print direction information of the test pattern printed on the substrate, in which the test pattern includes at least two print direction information.